Abstract: Examples of techniques for burn-in testing of an individually personalized device configuration are disclosed. In one example implementation according to aspects of the present disclosure, a computer-implemented method may include: retrieving the individually personalized device configuration; enabling a device to receive the individually personalized device configuration, wherein the device is one of a plurality of devices; and loading the individually personalized device configuration to the device that is enabled, wherein other devices of the plurality of devices are disabled from receiving the individually personalized device configuration.