Patents by Inventor Sovandy N. Prak

Sovandy N. Prak has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for storing failing part locations in a module
    Patent number: 7890819
    Abstract: A non-volatile storage device on a memory module comprising a plurality of memory devices is used to store the locations of defective parts on the memory module, such as data query (“DQ”) terminals, identified during a testing procedure. After testing, the non-volatile storage device, such as an electrically erasable programmable read only memory (“EEPROM”), may be accessed to determine specific memory devices such as dynamic random access memory (“DRAM”) which need to be repaired or replaced rather than re-testing the specific memory module.
    Type: Grant
    Filed: March 19, 2007
    Date of Patent: February 15, 2011
    Assignee: Micron Technology, Inc.
    Inventors: David E. Charlton, Sovandy N. Prak, Keith E. Robinson
  • Method and apparatus for storing failing part locations in a module
    Patent number: 7269765
    Abstract: A non-volatile storage device on a memory module comprising a plurality of memory devices is used to store the locations of defective parts on the memory module, such as data query (“DQ”) terminals, identified during a testing procedure. After testing, the non-volatile storage device, such as an electrically erasable programmable read only memory (“EEPROM”), may be accessed to determine specific memory devices such as dynamic random access memory (“DRAM”) which need to be repaired or replaced rather than re-testing the specific memory module.
    Type: Grant
    Filed: April 13, 2000
    Date of Patent: September 11, 2007
    Assignee: Micron Technology, Inc.
    Inventors: David E. Charlton, Sovandy N. Prak, Keith E. Robinson