Patents by Inventor Sovandy Prak

Sovandy Prak has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for storing failing part locations in a module
    Publication number: 20070288805
    Abstract: A non-volatile storage device on a memory module comprising a plurality of memory devices is used to store the locations of defective parts on the memory module, such as data query (“DQ”) terminals, identified during a testing procedure. After testing, the non-volatile storage device, such as an electrically erasable programmable read only memory (“EEPROM”), may be accessed to determine specific memory devices such as dynamic random access memory (“DRAM”) which need to be repaired or replaced rather than re-testing the specific memory module.
    Type: Application
    Filed: March 19, 2007
    Publication date: December 13, 2007
    Inventors: David Charlton, Sovandy Prak, Keith Robinson
  • Processing semiconductor devices having some defective input-output pins
    Patent number: 6778933
    Abstract: Techniques to process semiconductor devices whose input-output (I/O) pins are only partially operative is able to accommodate substantially all possible combinations of operative I/O pin patterns. Semiconductor devices are tested to determine which I/O pins are operative. A code representing which I/O pins are operative is then associated with each tested device. The generated codes are used to selectively combine two or more semiconductor devices to form a component capable of providing the function of a single fully operational semiconductor device.
    Type: Grant
    Filed: December 10, 2002
    Date of Patent: August 17, 2004
    Assignee: Micron Technology, Inc.
    Inventors: David Charlton, Sovandy Prak
  • Processing semiconductor devices having some defective input-output pins
    Publication number: 20030125896
    Abstract: Techniques to process semiconductor devices whose input-output (I/O) pins are only partially operative is able to accommodate substantially all possible combinations of operative I/O pin patterns. Semiconductor devices are tested to determine which I/O pins are operative. A code representing which I/O pins are operative is then associated with each tested device. The generated codes are used to selectively combine two or more semiconductor devices to form a component capable of providing the function of a single fully operational semiconductor device.
    Type: Application
    Filed: December 10, 2002
    Publication date: July 3, 2003
    Inventors: David Charlton, Sovandy Prak
  • Processing semiconductor devices having some defective input-output pins
    Patent number: 6510443
    Abstract: Techniques to process semiconductor devices whose input-output (I/O) pins are only partially operative is able to accommodate substantially all possible combinations of operative I/O pin patterns. Semiconductor devices are tested to determine which I/O pins are operative. A code representing which I/O pins are operative is then associated with each tested device. The generated codes are used to selectively combine two or more semiconductor devices to form a component capable of providing the function of a single fully operational semiconductor device.
    Type: Grant
    Filed: December 7, 1998
    Date of Patent: January 21, 2003
    Assignee: Micron Technology, Inc.
    Inventors: David Charlton, Sovandy Prak