Abstract: An imaging hypercentric lens assembly comprising of a First Lens Group that includes: 1) At least a first high NA (0.40 or greater) aspheric lens element followed by 2) at least a second lens element that converges the light emitted from the first element to a small spot. It is further comprised of a Second Lens Group whose entrance pupil is placed at the same position as said small light spot. The Second Lens Group serves to refocus the light and form an image of an object placed in front of the First Lens Group. In this combination, the present invention allows high NA aspheric lens elements to produce good quality images of objects whose size is not limited to being considerably smaller than the diameter of the clear aperture of the high NA aspheric lens element.

Abstract: A linear optical scanner wherein the linear optical scanner is disposed between a lens and the image plane of the lens allowing the image from the lens to be optically shifted along one dimension, and permits the image from the lens to be shifted linearly without scan error.

Abstract: A linear optical scanner wherein the linear optical scanner is disposed between a lens and the image plane of the lens allowing the image from the lens to be optically shifted along one dimension, and permits the image from the lens to be shifted linearly without scan error.

Abstract: A reflective telecentric lens which uses an on-axis type concave mirror in a pseudo-off-axis manner to avoid blockage of a portion of the field of view. The concave mirror used in a pseudo-off-axis manner permits the telecentric stop, imaging lens, and film or an electronic detector to be moved outside of the field of view.

Abstract: An optical image field splitting system which is adapted to allow a single camera to be used to view two or more images or object scenes of a single object or one or more images from a plurality of objects is disclosed. The optical image field splitting system includes a camera, a mirror pair, a lens, and a third mirror spaced apart from the mirror pair. The mirror pair includes a first mirror defining a first reflective planar surface and a second mirror defining a second reflective planar surface. The first reflective planar surface is oriented at a first predetermined angle relative to the second reflective planar surface. The lens is coupled to the camera and disposed in an optical path defined between the camera and the mirror pair. The third mirror defines a third reflective planar surface oriented at a second predetermined angle relative to the second reflective surface of the second mirror. An optical path length is defined between the third mirror and the second mirror.

Abstract: Spectral transmittance of a dye coating for optical data is determined off-line. Light source wavelength is then matched to the wavelengths at which the dye has the least transmission (i.e. maximum absorbance). The method and system of the present invention are provided for detecting local and global defects in the coating wherein the inspection is done at the maximum absorbance wavelengths to produce a maximum change in a transmitted light signal for a given change in physical thickness of the dye coating. Relative change in thickness is determined based on the change in the transmitted light signal through the dye coating. In order to complete detection and measurement of the transmittance changes, a pair of electronic signals are split from a camera signal wherein one of the electronic signals is filtered by a FIR filter to identify local changes in dye thickness against a globally varying background.

Abstract: First and second linearly polarized beams of light are incident on a magneto-optical disc at a common point. Both beams have equal or nearly equal intensity. Upon specular reflection from the disc, the first and second reflected beams travel through analyzers which are the same linear polarizers which originally polarized the second and first beams, respectively. The polarizers have an orientation such that the polarization angle between the first beam and the first polarizer is the same as the polarization angle between the second beam and the second polarizer. Consequently, the difference between the intensities of the two analyzed beams is proportional to Kerr rotation and independent of the direction of the stress axes of the magneto-optical disc substrate, and only mildly dependent on the magnitude of the retardation of the substrate.