Abstract: A test system may include test stations for testing a device under test. The test stations may each include test equipment that may be connected to a device under test using a test cable. The test cable may include a status indicator to indicate when tests have been passed or have failed. A first connector at one end of the test cable may be coupled to the test equipment. A second connector at an opposing end of the test cable may be coupled to the device under test. Communications through the first connector may use a first communications protocol. Communications through a first set of contacts in the second connector may use the first communications protocol. Communications through a second set of contacts in the second connector may use a second communications protocol.

Abstract: A test system for testing a device under test (DUT) is provided. The test system may include multiple test stations that are coupled to a network server. A master test station configuration file associated with each of the test stations may be stored on the network server. Each of the test stations may intermittently obtain updated test station configuration information from the network server to synchronize testing. A test station may be configured to check whether the DUT has successfully passed testing at preceding test stations. The test station may be given permission to write its test results into storage circuitry in the DUT. If test results are satisfactory, the DUT may be tested using a subsequent test station. If test results do not satisfy design criteria, the DUT may be sent to a corresponding repair station for rework.

Abstract: A test system may include test stations for testing a device under test. The test stations may each include test equipment that may be connected to a device under test using a test cable. The test cable may include a status indicator to indicate when tests have been passed or have failed. A first connector at one end of the test cable may be coupled to the test equipment. A second connector at an opposing end of the test cable may be coupled to the device under test. Communications through the first connector may use a first communications protocol. Communications through a first set of contacts in the second connector may use the first communications protocol. Communications through a second set of contacts in the second connector may use a second communications protocol.