Abstract: Apparatuses, systems, and techniques to control utilization of a combination of processing cores. In at least one embodiment, utilization of a combination of processing cores is controlled based, at least in part, on historic thermal characteristics of the combination of the processing cores.

Abstract: A system includes a processing unit coupled with one or more switches via one or more links. The processing unit is to determine a total threshold power value associated with the processing unit and the one or more links and estimate a power consumption value associated with a switch of the one or more switches. The processing unit can also determine the power consumption value of the switch and a second power consumption value of the processing unit fail to satisfy the total power threshold value and responsive to determining the power consumption value and the second power consumption value fail to satisfy the total power threshold value, increase an amount of power supplied to the processing unit to satisfy the total power threshold value.

Abstract: Apparatuses, systems, and techniques to optimize processor performance. In at least one embodiment, a method increases an operation voltage of one or more processors, based at least in part, on one or more error rates of the one or more processors.

Abstract: A datacenter power management system and method is disclosed. A plurality of computing units are enabled to operate at a second frequency, higher than a first frequency, in response to determining from respective power coefficients for these computing units, that a power level at this higher frequency remains below a power budget.

Abstract: Apparatuses, systems, and techniques to optimize performance of a processor group. In at least one embodiment, a method increases a processor's clock frequency based, at least in part, on performance of other processors in a group.

Abstract: Apparatuses, systems, and techniques adjust a frequency at which a processor operates. In at least one embodiment, a frequency at which a processor operates is adjusted based, at least in part, on different cores of the processor performing one or more identical instructions.

Abstract: Apparatuses, systems, and techniques to optimize processor performance. In at least one embodiment, a method increases an operation voltage of one or more processors, based at least in part, on one or more error rates of the one or more processors.

Abstract: Latency of in-system test (IST) execution for a hardware component of an in-field (deployed) computing platform may be reduced when a value of a physical operating parameter can be changed without rebooting the computing platform. A test (e.g., patterns or vectors) is executed for varying values of the physical operating parameter (e.g., supply voltage, clock speed, temperature, noise magnitude/duration, operating current, and the like), providing the ability to detect faults in the hardware components.

Abstract: A system to select graphics processing units (GPUs) to execute a task is disclosed. In at least one embodiment, GPUs are selected based on one or more task parameters and one or more fused parameters.

Abstract: A datacenter power management system and method is disclosed.

Abstract: Apparatuses, systems, and techniques to power balance multiple chips. In at least one embodiment, a system includes a plurality of processors having substantially equal performance capability and different power consumption capability, where a cumulative power consumption of the processors is not to exceed a system power threshold if each processor is operated at substantially peak performance.

Abstract: Latency of in-system test (IST) execution for a hardware component of an in-field (deployed) computing platform may be reduced when a value of a physical operating parameter can be changed without rebooting the computing platform. A test (e.g., patterns or vectors) is executed for varying values of the physical operating parameter (e.g., supply voltage, clock speed, temperature, noise magnitude/duration, operating current, and the like), providing the ability to detect faults in the hardware components.

Abstract: Some embodiments include apparatuses and methods of using such apparatuses. One of the apparatuses includes voltage regulators in an integrated circuit device, and a frequency control block and a module included in the integrated circuit device. Each of the voltage regulators includes a current sensor. The frequency control block operates to provide a clock signal to each of the voltage regulators. The clock signal has a frequency based on digital information. The module operates to receive a current from the current sensor of each of the voltage regulators and provides the digital information to the frequency control block to control the frequency of the clock signal. The digital information has a value based on the current from each of the current sensors.

Abstract: Some embodiments include apparatuses and methods of using such apparatuses. One of the apparatuses includes voltage regulators in an integrated circuit device, and a frequency control block and a module included in the integrated circuit device. Each of the voltage regulators includes a current sensor. The frequency control block operates to provide a clock signal to each of the voltage regulators. The clock signal has a frequency based on digital information. The module operates to receive a current from the current sensor of each of the voltage regulators and provides the digital information to the frequency control block to control the frequency of the clock signal. The digital information has a value based on the current from each of the current sensors.