Abstract: Circuits and method for precharging a pair of complementary bitlines in a dynamic random access memory (DRAM). Both bitlines are precharged to VDD during a precharge phase, and during a sensing phase, the voltage of one of the pair of complementary bitlines is adjusted from VDD to a reference level. The reference level is generated by coupling the one of the pair of complementary bitlines to a capacitance means located within a reference voltage circuit. The reference voltage circuit can include one capacitor element or a plurality of capacitor elements connected in parallel with each other. Any number of the plurality of capacitor elements can be selectively enabled.

Abstract: Circuits and method for precharging a pair of complementary bitlines in a dynamic random access memory (DRAM). Both bitlines are precharged to VDD during a precharge phase, and during a sensing phase, the voltage of one of the pair of complementary bitlines is adjusted from VDD to a reference level. The reference level is generated by coupling the one of the pair of complementary bitlines to a capacitance means located within a reference voltage circuit. The reference voltage circuit can include one capacitor element or a plurality of capacitor elements connected in parallel with each other. Any number of the plurality of capacitor elements can be selectively enabled.

Abstract: Quiescent current drawn by an array of four-transistor loadless static random access memory (SRAM) cells is minimized by using a negative feedback loop to set a reference voltage, for the wordline driver, to a level which reduces the subthreshold current through the pass transistors to a level which is just barely sufficient to reliably retain data.

Abstract: A method (40) of designing a circuit comprising a plurality of transistors (10, 46T, 60T). Each transistor of the plurality of transistors comprises an active region, a gate (G1, G2), a first source/drain (S/D1, S/D3) in the active region, a second source/drain in the active region, and at least one contact in each of the first source/drain and the second source/drain. The method comprises various steps. The method specifies a first set of distances for each transistor in a first set (10) of transistors in the plurality of transistors, wherein the first set of distances comprises a gate length (Lg), a gate width (Wg), and a distance representative of one or both of a first contact-to-edge distance (CTE1) and a first contact-to-gate distance (CTG1).

Abstract: Quiescent current drawn by an array of four-transistor loadless static random access memory (SRAM) cells is minimized by using a negative feedback loop to set a reference voltage, for the wordline driver, to a level which reduces the subthreshold current through the pass transistors to a level which is just barely sufficient to reliably retain data.

Abstract: A method (40) of designing a circuit comprising a plurality of transistors (10, 46T, 60T). Each transistor of the plurality of transistors comprises an active region, a gate (G1, G2), a first source/drain (S/D1, S/D3) in the active region, a second source/drain in the active region, and at least one contact in each of the first source/drain and the second source/drain. The method comprises various steps. The method specifies a first set of distances for each transistor in a first set (10) of transistors in the plurality of transistors, wherein the first set of distances comprises a gate length (Lg), a gate width (Wg), and a distance representative of one or both of a first contact-to-edge distance (CTE1) and a first contact-to-gate distance (CTG1).