Patents by Inventor Sreeja Chowdhury

Sreeja Chowdhury has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11657405
    Abstract: Embodiments of the present disclosure provide methods, systems, apparatus, and computer program products are for detecting whether a suspect component such as an integrated circuit (IC) or a system-on-chip (SoC) is recycled. Specifically, various embodiments involve processing power supply rejection ratio (PSRR) data obtained from a low drop-out regulator (LDO) used for the suspect component using a recycle detection machine learning model to generate a recycle prediction. In particular embodiments, the recycle detection machine learning model is developed based at least in part on degradation of PSRRs of LDOs. Accordingly, a determination is made as to whether the suspect component is recycled based on the recycle prediction. If so, then an indication that the suspect component is recycled is provided.
    Type: Grant
    Filed: September 1, 2020
    Date of Patent: May 23, 2023
    Assignee: University of Florida Research Foundation, Incorporated
    Inventors: Sreeja Chowdhury, Fatemeh Ganji, Nima Maghari, Domenic J. Forte
  • Publication number: 20230085919
    Abstract: A method and system are directed to designing a low-dropout regulator (LDO) circuit and using the LDO circuit to detect recycled counterfeit integrated circuits. The LDO circuit includes, in part, a reference path circuit and a stressed path circuit. Each of the reference path circuit and the stressed path circuit is coupled to a control signal that can enable the corresponding path circuit for the LDO. LDO parameters can then be measured while the reference path circuit and the stressed path circuit is enabled respectively. The difference between the LDO parameters measured while the reference path circuit is enabled and while the stressed path circuit is enabled is used to determine if an integrated circuit comprising the LDO circuit is a recycled counterfeit.
    Type: Application
    Filed: June 22, 2022
    Publication date: March 23, 2023
    Inventors: Domenic J. Forte, Nima Maghari, Michael Levin, Sreeja Chowdhury
  • Publication number: 20210081574
    Abstract: Embodiments of the present disclosure provide methods, systems, apparatus, and computer program products are for detecting whether a suspect component such as an integrated circuit (IC) or a system-on-chip (SoC) is recycled. Specifically, various embodiments involve processing power supply rejection ratio (PSRR) data obtained from a low drop-out regulator (LDO) used for the suspect component using a recycle detection machine learning model to generate a recycle prediction. In particular embodiments, the recycle detection machine learning model is developed based at least in part on degradation of PSRRs of LDOs. Accordingly, a determination is made as to whether the suspect component is recycled based on the recycle prediction. If so, then an indication that the suspect component is recycled is provided.
    Type: Application
    Filed: September 1, 2020
    Publication date: March 18, 2021
    Inventors: Sreeja Chowdhury, Fatemeh Ganji, Nima Maghari, Domenic J. Forte