Abstract: An example apparatus described herein to implement cancellation pulse generation includes a first memory storing first subsets of data samples of a single pulse cancellation waveform. The example apparatus includes a second memory storing second subsets of data samples of the single pulse cancellation waveform, the second subsets including different data samples of the single pulse cancellation waveform than the first subsets. The example apparatus includes first circuitry coupled to the first memory and to the second memory in parallel. The example apparatus includes a plurality of buffers. The example apparatus includes second circuitry coupled to the plurality of buffers.

Abstract: An example apparatus to reduce crests in an input signal includes: memory; and programmable circuitry configured to: store a first copy and a second copy of a normalized window waveform in the memory, the first copy of the normalized window waveform including more data points than the second copy of the normalized window waveform; use the second copy of the normalized window waveform to generate a weight corresponding to a peak in the input signal; use the weight and the first copy of the normalized window waveform to generate an output waveform; generate a peak limiting waveform responsive to the output waveform; and combine the peak limiting waveform with the input signal to reduce an amplitude of the peak.

Abstract: Crest factor reduction circuitry includes: a peak neighborhood analyzer; peak detection circuitry and a controller. The peak neighborhood analyzer is configured to: receive an input signal; analyze the input signal to determine whether a peak larger than a target threshold is expected within an interval; and provide a first control signal responsive to determining that a peak larger than the target threshold is expected within the interval. The controller is configured to: receive the first control signal; and gate a clock or data to the peak detection circuitry responsive to the first control signal.

Abstract: An example apparatus includes: crest factor reduction circuitry having a signal input and a peak cancellation waveform input; and peak cancellation waveform generator circuitry including: carrier profile analyzer circuitry having a signal input coupled to the signal input of the crest factor reduction circuitry, and having a carrier profile output; waveform construction circuitry having a carrier profile input coupled to the carrier profile output of the carrier profile analyzer circuitry, having a second input, and having a peak cancellation waveform output coupled to the peak cancellation waveform input of the crest factor reduction circuitry; and profile change detector circuitry having a carrier profile input coupled to the carrier profile output of the carrier profile analyzer circuitry, and having an output coupled to the second input of the waveform construction circuitry.

Abstract: An example apparatus includes: nonlinearity function selection circuitry with an output, the nonlinearity function selection circuitry to select a type of a nonlinearity function, the nonlinearity function to model nonlinearity portions of data output from an analog-to-digital converter, nonlinearity function term generation circuitry with a first input coupled to the output, the nonlinearity function term generation circuitry to generate one or more nonlinearity function terms of the nonlinearity function based on the type of the nonlinearity function and the data, and coefficient determination circuitry with a second input coupled to the output, the coefficient determination circuitry to determine one or more nonlinearity function coefficients based on the one or more nonlinearity function terms, the nonlinearity portions of the data to be compensated based on the one or more nonlinearity function coefficients.

Abstract: An inverter includes a capacitive module and a first power module connected to the capacitive module by a first DC connection and includes a first AC connection arranged on an opposite side of the first power module. A second power module is connected to the capacitive module by a second DC connection and includes a second AC connection arranged on an opposite side of the second power module. The power modules are arranged on the same side of the capacitive module, on either side of a median plane of the capacitive module, the AC connections being closer to the median plane of the capacitive module than the DC connections.

Abstract: An example apparatus includes: nonlinearity function selection circuitry with an output, the nonlinearity function selection circuitry to select a type of a nonlinearity function, the nonlinearity function to model nonlinearity portions of data output from an analog-to-digital converter, nonlinearity function term generation circuitry with a first input coupled to the output, the nonlinearity function term generation circuitry to generate one or more nonlinearity function terms of the nonlinearity function based on the type of the nonlinearity function and the data, and coefficient determination circuitry with a second input coupled to the output, the coefficient determination circuitry to determine one or more nonlinearity function coefficients based on the one or more nonlinearity function terms, the nonlinearity portions of the data to be compensated based on the one or more nonlinearity function coefficients.

Abstract: A personal navigation device includes a correlator for processing GNSS signals from a constellation of satellites A signal is received from a navigation beacon containing a repeating code word, in which the code word includes a number N of samples corresponding to N phases, and in which reception of each code word occurs within a defined time period T. The sequence of N code samples is correlated with a known code word to determine a maximum value of correlation for a particular phase of the received signal. The correlation is performed using a correlator of size M, in which M is less than N, such that N/M=P complete correlations for a partial code phase are performed such that each correlation of a partial code phase is performed within a time period of approximately T/P. All P correlations of partial code phases are completed within time T.

Abstract: A non-linearity correction circuit includes a non-linearity coefficient estimation circuit. The non-linearity coefficient estimation circuit includes a data capture circuit, a non-linearity term generation circuit, a time-to-frequency conversion circuit, a bin identification circuit, a residual non-linearity conversion circuit, and a non-linearity coefficient generation circuit. The non-linearity term generation circuit is coupled to the data capture circuit. The time-to-frequency conversion circuit is coupled to the data capture circuit and the non-linearity term generation circuit. The bin identification circuit is coupled to the time-to-frequency conversion circuit. The residual non-linearity conversion circuit is coupled to the bin identification circuit. The non-linearity coefficient generation circuit is coupled to the bin identification circuit and the residual non-linearity conversion circuit.

Abstract: A non-linearity correction circuit includes a non-linearity coefficient estimation circuit. The non-linearity coefficient estimation circuit includes a data capture circuit, a non-linearity term generation circuit, a time-to-frequency conversion circuit, a bin identification circuit, a residual non-linearity conversion circuit, and a non-linearity coefficient generation circuit. The non-linearity term generation circuit is coupled to the data capture circuit. The time-to-frequency conversion circuit is coupled to the data capture circuit and the non-linearity term generation circuit. The bin identification circuit is coupled to the time-to-frequency conversion circuit. The residual non-linearity conversion circuit is coupled to the bin identification circuit. The non-linearity coefficient generation circuit is coupled to the bin identification circuit and the residual non-linearity conversion circuit.

Abstract: A personal navigation device includes a correlator for processing GNSS signals from a constellation of satellites A signal is received from a navigation beacon containing a repeating code word, in which the code word includes a number N of samples corresponding to N phases, and in which reception of each code word occurs within a defined time period T. The sequence of N code samples is correlated with a known code word to determine a maximum value of correlation for a particular phase of the received signal. The correlation is performed using a correlator of size M, in which M is less than N, such that N/M=P complete correlations for a partial code phase are performed such that each correlation of a partial code phase is performed within a time period of approximately T/P. All P correlations of partial code phases are completed within time T.

Abstract: A personal navigation device includes a correlator for processing GNSS signals from a constellation of satellites A signal is received from a navigation beacon containing a repeating code word, in which the code word includes a number N of samples corresponding to N phases, and in which reception of each code word occurs within a defined time period T. The sequence of N code samples is correlated with a known code word to determine a maximum value of correlation for a particular phase of the received signal. The correlation is performed using a correlator of size M, in which M is less than N, such that N/M=P complete correlations for a partial code phase are performed such that each correlation of a partial code phase is performed within a time period of approximately T/P. All P correlations of partial code phases are completed within time T.

Abstract: An interleaved ADC receives an RX signal attenuated by a DSA based on an active DSA setting, within a range of DSA settings (DSA setting range) corresponding to selectable attenuation steps, the DSA setting range partitioned into a number of DSA setting subranges (DSA subranges). The ADC includes an IL mismatch estimation engine in the digital signal path, with an estimation subrange blanker, and an IL mismatch estimator. The estimation subrange blanker is coupled to receive the IADC data stream, and responsive to a DSA subrange allocation signal to select, in each of successive aggregation cycles, IADC data corresponding to an active DSA setting that is within an allocated DSA subrange (DSA active data within an DSA allocated subrange).

Abstract: An interleaved ADC receives an RX signal attenuated by a DSA based on an active DSA setting, within a range of DSA settings (DSA setting range) corresponding to selectable attenuation steps, the DSA setting range partitioned into a number of DSA setting subranges (DSA subranges). The ADC includes an IL mismatch estimation engine in the digital signal path, with an estimation subrange blanker, and an IL mismatch estimator. The estimation subrange blanker is coupled to receive the IADC data stream, and responsive to a DSA subrange allocation signal to select, in each of successive aggregation cycles, IADC data corresponding to an active DSA setting that is within an allocated DSA subrange (DSA active data within an DSA allocated subrange).

Abstract: An embodiment provides a circuit for testing an integrated circuit. The circuit includes an input converter that receives N scan inputs and generates M pseudo scan inputs, where M and N are integers. A scan compression architecture is coupled to the input converter and generates P pseudo scan outputs in response to the M pseudo scan inputs. An output converter is coupled to the scan compression architecture and generates Q scan outputs in response to the P pseudo scan outputs, wherein P and Q are integers. The input converter receives the N scan inputs at a first frequency and generates the M pseudo scan inputs at a second frequency and the output converter receives the P pseudo scan outputs at the second frequency and generates the Q scan outputs at the first frequency.

Abstract: A re-sampler comprises: a plurality of multipliers configured to receive an input sample; and a plurality of accumulators coupled to the multipliers and configured to form multiplier-accumulator (MAC) units with the multipliers, wherein the MAC units are configured to: compute partial products from the input sample, accumulate the partial products over clock cycles, and sequentially generate output samples based on the computing and the accumulating. A method comprises: receiving input samples; computing partial products from the input samples; accumulating the partial products over clock cycles; and sequentially generating output samples based on the computing and the accumulating.

Abstract: A personal navigation device includes a correlator for processing GNNS signals from a constellation of satellites A signal is received from a navigation beacon containing a repeating code word, in which the code word includes a number N of samples corresponding to N phases, and in which reception of each code word occurs within a defined time period T. The sequence of N code samples is correlated with a known code word to determine a maximum value of correlation for a particular phase of the received signal. The correlation is performed using a correlator of size M, in which M is less than N, such that N/M=P complete correlations for a partial code phase are performed such that each correlation of a partial code phase is performed within a time period of approximately T/P. All P correlations of partial code phases are completed within time T.

Abstract: An embodiment provides a circuit for testing an integrated circuit. The circuit includes an input converter that receives N scan inputs and generates M pseudo scan inputs, where M and N are integers. A scan compression architecture is coupled to the input converter and generates P pseudo scan outputs in response to the M pseudo scan inputs. An output converter is coupled to the scan compression architecture and generates Q scan outputs in response to the P pseudo scan outputs, wherein P and Q are integers. The input converter receives the N scan inputs at a first frequency and generates the M pseudo scan inputs at a second frequency and the output converter receives the P pseudo scan outputs at the second frequency and generates the Q scan outputs at the first frequency.

Abstract: An embodiment provides a circuit for testing an integrated circuit. The circuit includes an input converter that receives N scan inputs and generates M pseudo scan inputs, where M and N are integers. A scan compression architecture is coupled to the input converter and generates P pseudo scan outputs in response to the M pseudo scan inputs. An output converter is coupled to the scan compression architecture and generates Q scan outputs in response to the P pseudo scan outputs, wherein P and Q are integers. The input converter receives the N scan inputs at a first frequency and generates the M pseudo scan inputs at a second frequency and the output converter receives the P pseudo scan outputs at the second frequency and generates the Q scan outputs at the first frequency.

Abstract: A clock dithering circuit that provides cancellation of digital noise spurs is disclosed. The clock dithering circuit includes a control unit that receives an input clock. An ICG (integrated clock gating) cell receives the input clock and receives an enable signal from the control unit. The ICG cell generates a gated clock. A coarse dither unit receives the gated clock and receives a coarse select signal from the control unit. The coarse dither unit generates a coarse dither clock. A fine dither unit receives the coarse dither clock and receives a fine select signal from the control unit. The fine dither unit generates a fine dither clock.