Patents by Inventor Sreenivas Yelneedi

Sreenivas Yelneedi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8224473
    Abstract: An apparatus for monitoring an industrial process comprising a plurality of variables. The apparatus comprises a defining module configured for defining a normal-condition data set may comprise data values of the variables when the industrial process is operating under a normal condition and for defining an abnormal-condition data set may comprise data values of the variables when the industrial process is operating under an abnormal condition; a modelling module configured for modelling a normal-condition model from the normal-condition data set and modelling an abnormal-condition model from the abnormal-condition data set; a plotting module configured for plotting a normal-condition plot from the normal-condition model and plotting an abnormal-condition plot from the abnormal-condition model; and an analysis module configured for analysing live data values of the variables for simultaneous display with the normal-condition plot and the abnormal-condition plot.
    Type: Grant
    Filed: January 26, 2010
    Date of Patent: July 17, 2012
    Assignee: Yokogawa Electric Corporation
    Inventors: Sankar Selvaraj, Joseph Ching Hua Lee, Sreenivas Yelneedi
  • Publication number: 20100286969
    Abstract: An apparatus for monitoring an industrial process comprising a plurality of variables. The apparatus comprises a defining module configured for defining a normal-condition data set may comprise data values of the variables when the industrial process is operating under a normal condition and for defining an abnormal-condition data set may comprise data values of the variables when the industrial process is operating under an abnormal condition; a modelling module configured for modelling a normal-condition model from the normal-condition data set and modelling an abnormal-condition model from the abnormal-condition data set; a plotting module configured for plotting a normal-condition plot from the normal-condition model and plotting an abnormal-condition plot from the abnormal-condition model; and an analysis module configured for analysing live data values of the variables for simultaneous display with the normal-condition plot and the abnormal-condition plot.
    Type: Application
    Filed: January 26, 2010
    Publication date: November 11, 2010
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Sankar Selvaraj, Joseph Ching Hua Lee, Sreenivas Yelneedi