Patents by Inventor Srichand Hinduja

Srichand Hinduja has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of measuring the wall thickness of an article and an apparatus for making such measurements
    Patent number: 11415411
    Abstract: A method of (measuring the waif thickness of an article comprising the steps of (a) providing an inspection machine having an inspection machine co-ordinate system associated therewith, the inspection machine comprising a thickness measuring probe; (b) providing an article in a first position relative to the inspection machine; (c) measuring a plurality of surface points on at least a portion of the surface of the article; (d) modelling the at least a portion of the surface of the article from the measured surface points to produce a surface model; (e) generating a probe path from the surface model in an article coordinate system fixed relative to the article; (f) transforming the probe path to the inspection machine co-ordinate system; and, (g) moving the thickness measuring probe along the probe path whilst making a plurality of spaced apart wall thickness measurements of the article.
    Type: Grant
    Filed: July 13, 2017
    Date of Patent: August 16, 2022
    Assignee: ELE ADVANCED TECHNOLOGIES LIMITED
    Inventor: Srichand Hinduja
  • A METHOD OF MEASURING THE WALL THICKNESS OF AN ARTICLE AND AN APPARATUS FOR MAKING SUCH MEASUREMENTS
    Publication number: 20200064127
    Abstract: A method of (measuring the waif thickness of an article comprising the steps of (a) providing an inspection machine having an inspection machine co-ordinate system associated therewith, the inspection machine comprising a thickness measuring probe; (b) providing an article in a first position relative to the inspection machine; (c) measuring a plurality of surface points on at least a portion of the surface of the article; (d) modelling the at least a portion of the surface of the article from the measured surface points to produce a surface model; (e) generating a probe path from the surface model in an article coordinate system fixed relative to the article; (f) transforming the probe path to the inspection machine co-ordinate system; and, (g) moving the thickness measuring probe along the probe path whilst making a plurality of spaced apart wall thickness measurements of the article.
    Type: Application
    Filed: July 13, 2017
    Publication date: February 27, 2020
    Applicant: ELE ADVANCED TECHNOLOGIES LIMITED
    Inventor: Srichand Hinduja