Patents by Inventor Srinivas Kumar Vooka

Srinivas Kumar Vooka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • On-chip field testing methods and apparatus
    Patent number: 9836373
    Abstract: On-chip field testing methods and apparatus are disclosed. Example on-chip testers disclosed herein include a decoder having a test data input and a test stimuli interface. Disclosed example on-chip testers also include a multiplexer having a first multiplexer interface coupled to the test stimuli interface, a second multiplexer interface coupled to an automatic test equipment interface, a third multiplexer interface coupled to a design-for-testing subsystem interface and an interface selection input. Disclosed example on-chip testers further include a memory having a memory interface coupled to the test data input.
    Type: Grant
    Filed: February 24, 2015
    Date of Patent: December 5, 2017
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Srinivas Kumar Vooka, Vishwanath S, Pranav Murthy, Ratheesh Thekke Veetil, Rahul Gulati
  • ON-CHIP FIELD TESTING METHODS AND APPARATUS
    Publication number: 20160146888
    Abstract: On-chip field testing methods and apparatus are disclosed. Example on-chip testers disclosed herein include a decoder having a test data input and a test stimuli interface. Disclosed example on-chip testers also include a multiplexer having a first multiplexer interface coupled to the test stimuli interface, a second multiplexer interface coupled to an automatic test equipment interface, a third multiplexer interface coupled to a design-for-testing subsystem interface and an interface selection input. Disclosed example on-chip testers further include a memory having a memory interface coupled to the test data input.
    Type: Application
    Filed: February 24, 2015
    Publication date: May 26, 2016
    Inventors: Srinivas Kumar Vooka, Vishwanath S, Pranav Murthy, Ratheesh Thekke Veetil, Rahul Gulati
  • Structures and control processes for efficient generation of different test clocking sequences, controls and other test signals in scan designs with multiple partitions, and devices, systems and processes of making
    Patent number: 8438437
    Abstract: A scannable integrated circuit (100) including a functional integrated circuit (P1, P2) having scan chains, multiple scan decompressors (120.1, 120.2), each operable to supply scan bits to some of the scan chains (101.k, 102.k), a shared scan-programmable control circuit (110, 300), a tree circuit (400) coupled with the functional integrated circuit (P1, P2), the shared scan-programmable control circuit (110, 300) coupled to control the tree circuit (400), and a selective coupling circuit (180) operable to provide selective coupling with the shared scan-programmable control circuit (110, 300) for scan programming through any of the multiple scan decompressors (120.1, 120.2). Other circuits, devices, systems, and processes of operation and manufacture are disclosed.
    Type: Grant
    Filed: November 3, 2010
    Date of Patent: May 7, 2013
    Assignee: Texas Instruments Incorporated
    Inventors: Arvind Jain, Prashant Mohan Kulkarni, Srinivas Kumar Vooka, Sundarrajan Subramanian, Rubin Ajit Parekhji
  • STRUCTURES AND CONTROL PROCESSES FOR EFFICIENT GENERATION OF DIFFERENT TEST CLOCKING SEQUENCES, CONTROLS AND OTHER TEST SIGNALS IN SCAN DESIGNS WITH MULTIPLE PARTITIONS, AND DEVICES, SYSTEMS AND PROCESSES OF MAKING
    Publication number: 20120030532
    Abstract: A scannable integrated circuit (100) including a functional integrated circuit (P1, P2) having scan chains, multiple scan decompressors (120.1, 120.2), each operable to supply scan bits to some of the scan chains (101.k, 102.k), a shared scan-programmable control circuit (110, 300), a tree circuit (400) coupled with the functional integrated circuit (P1, P2), the shared scan-programmable control circuit (110, 300) coupled to control the tree circuit (400), and a selective coupling circuit (180) operable to provide selective coupling with the shared scan-programmable control circuit (110, 300) for scan programming through any of the multiple scan decompressors (120.1, 120.2). Other circuits, devices, systems, and processes of operation and manufacture are disclosed.
    Type: Application
    Filed: November 3, 2010
    Publication date: February 2, 2012
    Applicant: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Arvind Jain, Prashant Mohan Kulkarni, Srinivas Kumar Vooka, Sundarrajan Subramanian, Rubin Ajit Parekhji