Patents by Inventor Sriram Mandyam

Sriram Mandyam has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230086626
    Abstract: A test and measurement device has an interface, one or more connectors, each connector to allow the test and measurement device to connect to a test and measurement instrument, and one or more processors, the one or more processors configured to execute code to cause the one or more processors to: receive one or more user inputs through the interface identifying one or more tests to perform on a device under test (DUT); form a connection through one of the one or more connectors to the DUT to perform the one or more tests and receive test result data; apply one or more machine learning models to the test result data to identify potentially anomalous test results; and generate and present a representation of the test result data and the potentially anomalous test results.
    Type: Application
    Filed: September 20, 2022
    Publication date: March 23, 2023
    Applicant: Tektronix, Inc.
    Inventors: Siby Charley Pulikottil, Sriram Mandyam Krishnakumar, Mahesha Guttahalli Lakshmipathy
  • Patent number: 11442105
    Abstract: Disaggregated distributed measurement analysis systems provide a test and measurement automation platform that uses solution workflow metadata to create automation test suites as solutions to be deployed in an automation engine of a test and measurement automation platform. The automation platform provides tools and techniques to develop measurements and deploy solutions in an automation engine without requiring the system to restart. The system enables, by the test and measurement automation platform, a user to develop measurements for the solutions and deploy and execute each of the solutions in the automation engine of the test and measurement automation platform without requiring the solution to compile.
    Type: Grant
    Filed: January 10, 2020
    Date of Patent: September 13, 2022
    Assignee: Tektronix, Inc.
    Inventors: Sriram Mandyam Krishnakumar, Mahesha Guttahalli Lakshmipathy, Satish Kumar Makanahalli Ramaiah, Vishnu Vardhan Kandan, Rovin Jolly Pulikken
  • Patent number: 11442102
    Abstract: A test and measurement system for parallel waveform analysis acquires waveforms resulting from performing tests on a device under test (DUT) and performs, at least partially in parallel, respective analyses of the waveforms resulting from performing tests on the DUT. The system also acquires a first waveform resulting from performing a first test with an oscilloscope on a DUT and performs analysis of the first waveform at least partially in parallel with acquiring a second waveform. Additionally, the system tracks a plurality of testing assets using inventory information of a plurality of testing equipment on the network and enables remote users to access equipment logs and results of the respective analyses of the waveforms stored on a cloud computing system for performance of analytics.
    Type: Grant
    Filed: May 10, 2020
    Date of Patent: September 13, 2022
    Assignee: Tektronix, Inc.
    Inventors: Sriram Mandyam Krishnakumar, Sunil Mahawar, Mahesha Guttahalli Lakshmipathy, Satish Kumar Makanahalli Ramaiah
  • Publication number: 20200363471
    Abstract: A test and measurement system for parallel waveform analysis acquires waveforms resulting from performing tests on a device under test (DUT) and performs, at least partially in parallel, respective analyses of the waveforms resulting from performing tests on the DUT. The system also acquires a first waveform resulting from performing a first test with an oscilloscope on a DUT and performs analysis of the first waveform at least partially in parallel with acquiring a second waveform. Additionally, the system tracks a plurality of testing assets using inventory information of a plurality of testing equipment on the network and enables remote users to access equipment logs and results of the respective analyses of the waveforms stored on a cloud computing system for performance of analytics.
    Type: Application
    Filed: May 10, 2020
    Publication date: November 19, 2020
    Applicant: Tektronix, Inc.
    Inventors: Sriram Mandyam Krishnakumar, Sunil Mahawar, Mahesha Guttahalli Lakshmipathy, Satish Kumar Makanahalli Ramaiah
  • Publication number: 20200225287
    Abstract: Disaggregated distributed measurement analysis systems provide a test and measurement automation platform that uses solution workflow metadata to create automation test suites as solutions to be deployed in an automation engine of a test and measurement automation platform. The automation platform provides tools and techniques to develop measurements and deploy solutions in an automation engine without requiring the system to restart. The system enables, by the test and measurement automation platform, a user to develop measurements for the solutions and deploy and execute each of the solutions in the automation engine of the test and measurement automation platform without requiring the solution to compile.
    Type: Application
    Filed: January 10, 2020
    Publication date: July 16, 2020
    Inventors: Sriram Mandyam Krishnakumar, Mahesha Guttahalli Lakshmipathy, Satish Kumar Makanahalli Ramaiah, Vishnu Vardhan Kandan, Rovin Jolly Pulikken
  • Patent number: 6285974
    Abstract: One aspect of the invention relates to a method for detecting architectural violations in a multiprocessor computer system. In one version of the invention, the method includes the steps of generating a testcase instruction stream having a plurality of instructions, executable by the processors, which access a memory which is shared by the processors; detecting dependent instructions in the testcase instruction stream; and modifying the testcase instruction stream by inserting logging instructions in the testcase in the testcase instruction stream which cause data associated with observable instructions to be written to a logging memory by writing a first sequence of unique monotonically increasing values to the memory.
    Type: Grant
    Filed: May 4, 1999
    Date of Patent: September 4, 2001
    Assignee: International Business Machines Corporation
    Inventors: Sriram Mandyam, Brian Walter O'Krafka, Ramanathan Raghavan, Robert James Ramirez, Miwako Tokugawa
  • Patent number: 5928334
    Abstract: One aspect of the invention relates to a method for detecting synchronization violations in a multiprocessor computer system having a memory location which controls access to a portion of memory shared by the processors, the memory location having at least one lock bit indicating whether the portion of memory is locked by one of the processors and a plurality of bits for storing a data value. The method comprises reading the memory location by an individual processor; testing the lock bit to determine whether the portion of memory is locked; if the portion of memory is not locked; asserting the lock bit to indicate the portion of memory is locked; incrementing the data value to represent a global access count; writing the lock bit and the data value back to the memory location; and incrementing a data value stored in a memory location associated with the individual processor to indicate an individual access count by the individual processor.
    Type: Grant
    Filed: March 28, 1997
    Date of Patent: July 27, 1999
    Assignee: International Business Machines Corporation
    Inventors: Sriram Mandyam, Brian Walter O'Krafka, Ramanathan Raghavan, Robert James Ramirez, Miwako Tokugawa