Patents by Inventor Srirama Pedarla

Srirama Pedarla has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • AC testing of leakage current in integrated circuits using RC time constant
    Patent number: 7348790
    Abstract: Some embodiments of the invention include apparatus and systems having integrated circuits. Terminals or pins of the integrated circuits are configured to be driven to a state, to be floated for a time interval, and to be measured to determine the state of the terminals after the time interval. The measurement involves sampling the RC time constant of leakage current of the terminals. Other embodiments are described and claimed.
    Type: Grant
    Filed: October 19, 2005
    Date of Patent: March 25, 2008
    Assignee: Intel Corporation
    Inventors: Tawfik R. Arabi, Gregory F. Taylor, Srirama Pedarla, Patrick Elwer, Dan Murray
  • AC testing of leakage current in integrated circuits using RC time constant
    Publication number: 20060033522
    Abstract: Some embodiments of the invention include apparatus and systems having integrated circuits. Terminals or pins of the integrated circuits are configured to be driven to a state, to be floated for a time interval, and to be measured to determine the state of the terminals after the time interval. The measurement involves sampling the RC time constant of leakage current of the terminals. Other embodiments are described and claimed.
    Type: Application
    Filed: October 19, 2005
    Publication date: February 16, 2006
    Inventors: Tawfik Arabi, Gregory Taylor, Srirama Pedarla, Patrick Elwer, Dan Murray
  • AC testing of leakage current in integrated circuits using RC time constant
    Publication number: 20040246017
    Abstract: A method of testing an integrated circuit includes applying a voltage to one of the pins of the integrated circuit. The pin is floated for a predetermined time. A measurement is performed after the predetermined time. The measurement involves sampling the RC time constant of leakage current of the pins.
    Type: Application
    Filed: July 12, 2004
    Publication date: December 9, 2004
    Applicant: Intel Corporation
    Inventors: Tawfik R. Arabi, Gregory F. Taylor, Srirama Pedarla, Patrick Elwer, Dan Murray
  • AC testing of leakage current in integrated circuits using RC time constant
    Patent number: 6777970
    Abstract: A method of testing an integrated circuit includes applying a voltage to one of the pins of the integrated circuit. The pin is floated for a predetermined time. A measurement is performed after the predetermined time. The measurement involves sampling the RC time constant of leakage current of the pins.
    Type: Grant
    Filed: April 19, 2001
    Date of Patent: August 17, 2004
    Assignee: Intel Corporation
    Inventors: Tawfik R. Arabi, Gregory F. Taylor, Srirama Pedarla, Patrick Elwer, Dan Murray
  • AC testing of leakage current
    Publication number: 20020153914
    Abstract: A method of leakage test for an integrated circuit by sampling the RC time constant of leakage current of the pins of the integrated circuit.
    Type: Application
    Filed: April 19, 2001
    Publication date: October 24, 2002
    Applicant: Intel Corporation
    Inventors: Tawfik R. Arabi, Gregory F. Taylor, Srirama Pedarla, Patrick Elwer, Dan Murray
  • Test and characterization of source synchronous AC timing specifications by trace length modulation of accurately controlled interconnect topology of the test unit interface
    Patent number: 6449742
    Abstract: An apparatus that can determine whether a Tva parameter and a Tvb parameter of a device under test (DUT) complies with a design specification where the device under test is coupled to a secondary device. The Tvb parameter corresponds to a setup time of the secondary device. The Tva parameter corresponds to the hold time of the secondary device. The apparatus allows the DUT to be coupled to a secondary device that normally operates with the DUT. The apparatus writes data to the DUT and secondary device. The data is then written back to the apparatus which then determines whether the DUT complies with the Tvb and Tva design specifications. The apparatus may also implement tunable delay circuits to compensate for different setup and hold times of the secondary device.
    Type: Grant
    Filed: August 11, 1999
    Date of Patent: September 10, 2002
    Assignee: Intel Corporation
    Inventors: Tawfik Arabi, Dave Riendeau, Srirama Pedarla, Greg Eberlein, Gary Andrew