Patents by Inventor Stéphane COMPAING

Stéphane COMPAING has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for testing a semiconductor device against electrostatic discharge
    Patent number: 9897644
    Abstract: A method of testing a semiconductor device against electrostatic discharge includes operating the semiconductor device, and, while operating the semiconductor device, monitoring a functional performance of the semiconductor device. The monitoring includes monitoring one or more signal waveforms of respective one or more signals on respective one or more pins of the semiconductor device to obtain one or more monitor waveforms, and monitoring one or more register values of one or more registers of the semiconductor device to obtain one or more monitor register values as function of time. The method includes applying an electrostatic discharge event to the semiconductor device while monitoring the functional performance of the semiconductor device. The method can further comprise determining a functional change from the one or more monitor waveforms and the one or more monitor register values as function of time.
    Type: Grant
    Filed: October 10, 2012
    Date of Patent: February 20, 2018
    Assignee: NXP USA, Inc.
    Inventors: Alain Salles, Patrice Besse, Stephane Compaing, Philippe DeBosque
  • METHOD AND SYSTEM FOR TESTING A SEMICONDUCTOR DEVICE AGAINST ELECTROSTATIC DISCHARGE
    Publication number: 20150276847
    Abstract: A method of testing a semiconductor device against electrostatic discharge includes operating the semiconductor device, and, while operating the semiconductor device, monitoring a functional performance of the semiconductor device. The monitoring includes monitoring one or more signal waveforms of respective one or more signals on respective one or more pins of the semiconductor device to obtain one or more monitor waveforms, and monitoring one or more register values of one or more registers of the semiconductor device to obtain one or more monitor register values as function of time. The method includes applying an electrostatic discharge event to the semiconductor device while monitoring the functional performance of the semiconductor device. The method can further comprise determining a functional change from the one or more monitor waveforms and the one or more monitor register values as function of time.
    Type: Application
    Filed: October 10, 2012
    Publication date: October 1, 2015
    Applicant: Freescale Semiconductor, Inc.
    Inventors: Alain SALLES, Patrice BESSE, Stéphane COMPAING, Philippe DEBOSQUE