Abstract: A system may measure a response associated with a sample to an excitation. The system may compute, using the measured response and the excitation as inputs to an inverse model or a predetermined predictive model, model parameters on a voxel-by-voxel basis in a forward model with multiple voxels that represent the sample. The predetermined predictive model was trained using training data for different excitation strengths, different measurement conditions, or both. The forward model may simulate response physics occurring within the sample to a given excitation, and the model parameters may include magnetic susceptibilities of the multiple voxels. Moreover, the system may determine an accuracy of the model parameters by comparing at least the measured response and a calculated predicted value of the response using the forward model, the model parameters and the excitation. When the accuracy exceeds a predefined value, the system may provide the model parameters as an output.

Abstract: The technology of this application relates to a method for removing reflections from an image. The method detects one or more reflection areas in the image, wherein each reflection area includes a reflection. Further, the method extracts the one or more reflection areas from the image, and removes the reflection from each of the extracted reflection areas.

Abstract: A system may measure a response associated with a sample to an excitation. The system may compute, using the measured response and the excitation as inputs to an inverse model or a predetermined predictive model, model parameters on a voxel-by-voxel basis in a forward model with multiple voxels that represent the sample. The predetermined predictive model was trained using training data for different excitation strengths, different measurement conditions, or both. The forward model may simulate response physics occurring within the sample to a given excitation, and the model parameters may include magnetic susceptibilities of the multiple voxels. Moreover, the system may determine an accuracy of the model parameters by comparing at least the measured response and a calculated predicted value of the response using the forward model, the model parameters and the excitation. When the accuracy exceeds a predefined value, the system may provide the model parameters as an output.

Abstract: A system may measure, using a measurement device, a response associated with a sample to an excitation. Then, the system may compute, using the measured response and the excitation as inputs to one of an inverse model and a predetermined predictive model, model parameters on a voxel-by-voxel basis in a forward model with multiple voxels that represent the sample. The forward model may simulate response physics occurring within the sample to a given excitation, and the model parameters may include magnetic susceptibilities of the multiple voxels. Moreover, the system may determine an accuracy of the model parameters by comparing at least the measured response and a calculated predicted value of the response using the forward model, the model parameters and the excitation. When the accuracy exceeds a predefined value, the system may provide the model parameters as an output to: a user, another electronic device, a display, and/or a memory.