Patents by Inventor Stan Weitz

Stan Weitz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of performing electrostatic discharge testing on a payment card
    Patent number: 8643378
    Abstract: Methods of performing electrostatic discharge testing on a transaction card are disclosed. A transaction card may be placed on an insulated surface. A grounding probe may be placed at a first location on the transaction card. A discharge probe may be charged to a known voltage level. The discharge probe may then be discharged at a second location on the transaction card. A discharge wave shape may be recorded from the ground probe, and one of a pass condition and a fail condition may be assigned based on at least the value of the known voltage level as compared to a reference voltage level. The first location and the second location may each be selected from a plurality of areas on the transaction card.
    Type: Grant
    Filed: January 24, 2011
    Date of Patent: February 4, 2014
    Assignee: Visa International Service Association
    Inventors: Mustafa Top, Edward Kurtek, Johan Ras, Dung Huynh, Stan Weitz, Chris Stanley Nelson
  • Method of performing electrostatic discharge testing on a payment card
    Publication number: 20110210723
    Abstract: Methods of performing electrostatic discharge testing on a transaction card are disclosed. A transaction card may be placed on an insulated surface. A grounding probe may be placed at a first location on the transaction card. A discharge probe may be charged to a known voltage level. The discharge probe may then be discharged at a second location on the transaction card. A discharge wave shape may be recorded from the ground probe, and one of a pass condition and a fail condition may be assigned based on at least the value of the known voltage level as compared to a reference voltage level. The first location and the second location may each be selected from a plurality of areas on the transaction card.
    Type: Application
    Filed: January 24, 2011
    Publication date: September 1, 2011
    Applicant: Visa U.S.A. Inc.
    Inventors: Mustafa Cemal Top, Edward Kurtek, Johan Ras, Dung Huynh, Stan Weitz, Chris Stanley Nelson
  • Methods of performing electrostatic discharge testing on a payment card
    Patent number: 7902831
    Abstract: Methods of performing electrostatic discharge testing on a transaction card are disclosed. A transaction card may be placed on an insulated surface. A grounding probe may be placed at a first location on the transaction card. A discharge probe may be charged to a known voltage level. The discharge probe may then be discharged at a second location on the transaction card. A discharge wave shape may be recorded from the ground probe, and one of a pass condition and a fail condition may be assigned based on at least the value of the known voltage level as compared to a reference voltage level. The first location and the second location may each be selected from a plurality of areas on the transaction card.
    Type: Grant
    Filed: January 18, 2008
    Date of Patent: March 8, 2011
    Assignee: Visa U.S.A. Inc.
    Inventors: Mustafa Cemal Top, Edward Kurtek, Johan Ras, Dung Huynh, Stan Weitz, Chris Stanley Nelson
  • METHODS OF PERFORMING ELECTROSTATIC DISCHARGE TESTING ON A PAYMENT CARD
    Publication number: 20080174315
    Abstract: Methods of performing electrostatic discharge testing on a transaction card are disclosed. A transaction card may be placed on an insulated surface. A grounding probe may be placed at a first location on the transaction card. A discharge probe may be charged to a known voltage level. The discharge probe may then be discharged at a second location on the transaction card. A discharge wave shape may be recorded from the ground probe, and one of a pass condition and a fail condition may be assigned based on at least the value of the known voltage level as compared to a reference voltage level. The first location and the second location may each be selected from a plurality of areas on the transaction card.
    Type: Application
    Filed: January 18, 2008
    Publication date: July 24, 2008
    Inventors: Mustafa Cemal Top, Edward Kurtek, Johan Ras, Dung Huynh, Stan Weitz, Chris Stanley Nelson