Patents by Inventor Stanley Curtis DODDS

Stanley Curtis DODDS has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9551669
    Abstract: Embodiments as disclosed herein provide a method and system that characterizes physical properties, such as thickness, uniformity, polarization, and/or sizes and locations of defect (e.g. defect density distribution) of crystalline structures grown on or thin films deposited on a substrate of a solid state light emitting device. The embodiments disclosed herein generally include exciting the light emitting device with an energy source and analyze optical energy emitted by the crystalline structures grown on or the thin films deposited on the substrate.
    Type: Grant
    Filed: March 11, 2014
    Date of Patent: January 24, 2017
    Assignee: Sof-Tek Integrators, Inc.
    Inventors: Daniel C. Morrow, Jonathan Dummer, Stanley Curtis Dodds
  • Publication number: 20140268152
    Abstract: Embodiments as disclosed herein provide a method and system that characterizes physical properties, such as thickness, uniformity, polarization, and/or sizes and locations of defect (e.g. defect density distribution) of crystalline structures grown on or thin films deposited on a substrate of a solid state light emitting device. The embodiments disclosed herein generally include exciting the light emitting device with an energy source and analyze optical energy emitted by the crystalline structures grown on or the thin films deposited on the substrate.
    Type: Application
    Filed: March 11, 2014
    Publication date: September 18, 2014
    Applicant: Sof-Tek Integrators, Inc. dba as Op-Test
    Inventors: Daniel C. MORROW, Jonathan DUMMER, Stanley Curtis DODDS