Patents by Inventor Stanley W. Polchlopek

Stanley W. Polchlopek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • IC chip stress testing
    Patent number: 7512506
    Abstract: Methods, systems and program products are disclosed for performing a stress test of a line in an integrated circuit (IC) chip. One embodiment of the method includes: applying a constant current Is to the line; and stress testing the line while applying the constant current Is such that the constant current Is is not altered by a resistance change due to an onset of electromigration.
    Type: Grant
    Filed: May 31, 2007
    Date of Patent: March 31, 2009
    Assignees: International Business Machines Corporation, Advanced Micro Devices, Inc.
    Inventors: Oliver Aubel, Tom C. Lee, Deborah M. Massey, Travis S. Merrill, Stanley W. Polchlopek, Alvin W. Strong, Timothy D. Sullivan
  • IC CHIP STRESS TESTING
    Publication number: 20080297188
    Abstract: Methods, systems and program products are disclosed for performing a stress test of a line in an integrated circuit (IC) chip. One embodiment of the method includes: applying a constant current IS to the line; and stress testing the line while applying the constant current IS such that the constant current IS is not altered by a resistance change due to an onset of electromigration.
    Type: Application
    Filed: May 31, 2007
    Publication date: December 4, 2008
    Applicants: International Business Machines Corporation, Advanced Micro Devices, Inc. (AMD)
    Inventors: Oliver Aubel, Tom C. Lee, Deborah M. Massey, Travis S. Merrill, Stanley W. Polchlopek, Alvin W. Strong, Timothy D. Sullivan