Abstract: A support device for supporting a transmission coil on the body of a patient, with a receiving or securing device or a receiving space for receiving or securing the transmission coil in and/or on the support device, and further comprising a detection device for detecting a process of application, a state of application, a process of removal and/or a state of removal of the support device relative to the body of the patient. Further pertaining to a method for operating such a device.

Abstract: A support device for supporting a transmission coil on the body of a patient, with a receiving or securing device or a receiving space for receiving or securing the transmission coil in and/or on the support device, and further comprising a detection device for detecting a process of application, a state of application, a process of removal and/or a state of removal of the support device relative to the body of the patient. Further pertaining to a method for operating such a device.

Abstract: A method and apparatus are provided for interfacing with a synchronous dynamic memory in which memory commands are provided to the memory. The memory is accessed in response to the memory commands. Read data is captured in a data capture circuit having a delay setting. The delay setting is updated in response to detection of a period of read inactivity of the memory.

Abstract: A method and apparatus are provided for interfacing with a synchronous dynamic memory in which memory commands are provided to the memory. The memory is accessed in response to the memory commands. Read data is captured in a data capture circuit having a delay setting. The delay setting is updated in response to detection of a period of read inactivity of the memory.

Abstract: A representation of a macro for an integrated circuit layout. The representation may define sub-circuit cells of a module. The module may have a predefined functionality. The sub-circuit cells may include at least one reusable circuit cell. The reusable circuit cell may be configured such that when the predefined functionality of the module is not used, the reusable circuit cell is available for re-use.

Abstract: A method of placing a clock signal supply network in a design representation for an integrated circuit. The design representation may comprise a plurality of clockable circuit cells. The method may comprise identifying a first of the clockable circuit cells in the design representation. The method may further comprise identifying a second of the clockable circuit cells in the design representation. The second clockable circuit cell may have a clock timing dependent relation relative to the first clockable circuit cell. The method may further comprise configuring the clock signal supply network. The clock signal supply network may be configured to supply respective clock signals to the first and said second clockable circuit cells. The clock signal supply network may be configured to route the respective clock signals such that a timing difference between the respective clock signals is protected from process, voltage and temperature (PVT) influences.

Abstract: An integrated circuit comprising a die having a surface. The die may comprise first and second areas. The first area may comprise first circuit cells. The first circuit cells may be configurable by user defined interconnections from above the surface. The second area may comprise a plurality of sub-circuit cells. The sub-circuit cells may form a module having a predefined functionality. The sub-circuit cells may include at least one second circuit cell. The second circuit cell may be configured such that when the predefined functionality of the module is not used, the second circuit cell is configurable by user defined interconnections from above the surface.

Abstract: A representation of a macro for an integrated circuit layout. The representation may define sub-circuit cells of a module. The module may have a predefined functionality. The sub-circuit cells may include at least one reusable circuit cell. The reusable circuit cell may be configured such that when the predefined functionality of the module is not used, the reusable circuit cell is available for re-use.

Abstract: A cache may comprise a memory and control logic. The memory may be configured for storing data buffered by the cache. The control logic may be configured controlling accesses to the memory. The control logic may comprise a pseudo-noise generator and a trigger device. The pseudo-noise generator may be configured for generating a pseudo-random number representing, for a miss access requiring allocation, which of a plurality of possible addresses in the memory to use for the allocation. The trigger device may be configured for controlling a cycle of the pseudo-noise generator to output the pseudo-random number therefrom.

Abstract: An addressable circuit configured to control a definition of an addressable range for the circuit. The circuit may comprise at least one register, at east one flag, an input and control logic. The register may be configured to define a range used for determining an addressable range for the circuit. The flag may be configured to define whether a predetermined range is to be inverted for determining the addressable range for the circuit. The input may be configured to receive an address for an access to the circuit. The control logic may be configured to process the received address to determine whether the received address is within the addressable range for the circuit, the control logic being responsive to the register and to the flag for determining the addressable range therefrom.

Abstract: A set-associative cache having a selectively configurable split/unified mode. The cache may comprise a memory and control logic. The memory may be configured for storing data buffered by the cache. The control logic may be configured for controlling the writing and reading of data to and from the memory. The control logic may organise the memory as a plurality of storage sets, each set being mapped to a respective plurality of external addresses such that data from any of said respective external addresses maps to that set. The control logic may comprise allocation logic for associating a plurality of ways uniquely with each set, the plurality of ways representing respective plural locations for storing data mapped to that set. In the unified mode, the control logic may assign a first plurality of ways to each set to define a single cache region.

Abstract: An apparatus for testing a functional operation of a memory related circuit. The memory related circuit may be represented by a first circuit model defining a circuit under test. The apparatus may comprise a storage device and a processor. The storage device may be configured for storing the first circuit model representing the circuit under test, and for storing a second circuit model. The second circuit model may represent a testbench circuit for interfacing with the circuit under test, and may include a first memory and monitor circuitry. The first memory may be configured for interfacing with a first port of the circuit under test. The monitor circuitry may be configured for interfacing with the at least one of said memory and a second port of the circuit under test, for monitoring the response of the circuit under test as simulated signals are applied thereto.