Abstract: The present invention relates in general to working machines with working units which are subject to fluctuating loads or have a fluctuating power consumption. The invention relates in particular to a drive train assembly for driving such a working unit, the drive train assembly having a flywheel accumulator for mitigating the load impacts or load fluctuations. According to the invention, a starting aid for easier starting up of the flywheel accumulator into its desired operating speed range is provided, the starting aid having a planetary transmission, which is connected in terms of drive to the flywheel accumulator, and a control actuator for braking and/or accelerating a planetary transmission element in order to adjust the step-up/step-down ratio of the planetary transmission when starting up the flywheel accumulator.

Abstract: An automated test system for testing singulated electronic components comprises a handler, comprising a plurality of handler pickers and/or spinner pickers, the handler pickers and/or spinner pickers being adapted to each pickup one electronic component, at least one processing station for processing one of the electronic components, a first carrier, a second carrier, and a test unit, for testing singulated electronic components located on a carrier. When the second plurality of electronic components on the second carrier are tested in the test unit while the second plurality of electronic components rest on the second carrier, simultaneously the first carrier is loaded with the first plurality of electronic components by the plurality of handler pickers and/or spinner pickers and/or unloaded from the first plurality of electronic components by the plurality of handler pickers and/or spinner pickers.

Abstract: A method for testing and calibrating electronic semiconductor components which convert sound into electrical signals acoustically irradiates the components in a sound chamber whose largest free length is less than half the wavelength of the highest frequency of the sound waves produced during the test.

Abstract: A test device, a test system, a method and a carrier for testing electronic components under variable pressure conditions comprise: a first chamber half and a second chamber half, a first gasket and a second gasket, a carrier segment adapted to carry a plurality of electronic components, and a circular carrier section surrounding the carrier segment. The circular carrier section comprises a first side and a second side. The first gasket is placed between the first chamber half and the first side of the circular carrier section to form an airtight seal and the second gasket is placed between the second chamber half and the second side of the circular carrier section to form an airtight seal.

Abstract: A method for testing and calibrating electronic semiconductor components which convert sound into electrical signals acoustically irradiates the components in a sound chamber whose largest free length is less than half the wavelength of the highest frequency of the sound waves produced during the test.