Patents by Inventor Stefan DeGendt

Stefan DeGendt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9337273
    Abstract: A semiconductor device is provided comprising a bilayer graphene comprising a first and a second adjacent graphene layer, and a first electrically insulating layer contacting the first graphene layer, the first electrically insulating layer comprising an electrically insulating material, and a substance suitable for creating free charge carriers of a first type in the first graphene layer, the semiconductor device further comprising an electrically insulating region contacting the second graphene layer and suitable for creating free charge carriers of a second type, opposite to the first type, in the second graphene layer.
    Type: Grant
    Filed: March 29, 2013
    Date of Patent: May 10, 2016
    Assignees: IMEC, Katholieke Universiteit Leuven, K.U. Leuven R&D
    Inventors: Amirhasan Nourbakhsh, Mirco Cantoro, Cedric Huyghebaert, Mark Heyns, Stefan DeGendt
  • Publication number: 20070077769
    Abstract: A method for removing organic contaminants from a semiconductor surface whereby the semiconductor is held in a tank and the tank is filled with a fluid such as a liquid or a gas. Organic contaminants, such as photoresist, photoresidue, and dry etched residue, occur in process steps of semiconductor fabrication and at times, require removal. The organic contaminants are removed from the semiconductor surface by holding the semiconductor inside a tank. The method may be practiced using gas phase processing or liquid phase processing. The tank is filled with a gas mixture, a liquid, and/or a fluid, such as water, water vapor, ozone and/or an additive acting as a scavenger (a substance which counteracts the unwanted effects of other constituents of the system).
    Type: Application
    Filed: April 28, 2006
    Publication date: April 5, 2007
    Applicant: Interuniversitair Micro-Elektronica Centrum vzw
    Inventors: Stefan DeGendt, Peter Snee, Marc Heyns
  • Patent number: 6551409
    Abstract: A method for removing organic contaminants from a semiconductor surface whereby the semiconductor is held in a tank and the tank is filled with a fluid such as a liquid or a gas. Organic contaminants, such as photoresist, photoresidue, and dry etched residue, occur in process steps of semiconductor fabrication and at times, require removal. The organic contaminants are removed from the semiconductor surface by holding the semiconductor inside a tank. The method is practiced using gas phase processing. The tank is filled with a gas mixture, comprising water vapor and ozone.
    Type: Grant
    Filed: September 18, 1998
    Date of Patent: April 22, 2003
    Assignees: Interuniversitair Microelektronica Centrum, vzw, Nederlandse Philips Bedrijven B.V.
    Inventors: Stefan DeGendt, Dirk Knotter, Marc Heyns, Marc Meuris, Paul Mertens
  • Publication number: 20020088478
    Abstract: A method for removing organic contaminants from a semiconductor surface whereby the semiconductor is held in a tank and the tank is filled with a fluid such as a liquid or a gas. Organic contaminants, such as photoresist, photoresidue, and dry etched residue, occur in process steps of semiconductor fabrication and at times, require removal. The organic contaminants are removed from the semiconductor surface by holding the semiconductor inside a tank. The method may be practiced using gas phase processing or liquid phase processing. The tank is filled with a gas mixture, a liquid, and/or a fluid, such as water, water vapor, ozone and/or an additive acting as a scavenger (a substance which counteracts the unwanted effects of other constituents of the system).
    Type: Application
    Filed: February 13, 1998
    Publication date: July 11, 2002
    Inventors: STEFAN DEGENDT, PETER SNEE
  • Publication number: 20020011257
    Abstract: A method for removing organic contaminants from a semiconductor surface whereby the semiconductor is held in a tank and the tank is filled with a fluid such as a liquid or a gas. Organic contaminants, such as photoresist, photoresidue, and dry etched residue, occur in process steps of semiconductor fabrication and at times, require removal. The organic contaminants are removed from the semiconductor surface by holding the semiconductor inside a tank. The method may be practiced using gas phase processing or liquid phase processing. The tank is filled with a gas mixture, a liquid, and/or a fluid, such as water, water vapor, ozone and/or an additive acting as a scavenger (a substance which counteracts the unwanted effects of other constituents of the system).
    Type: Application
    Filed: December 8, 1998
    Publication date: January 31, 2002
    Inventors: STEFAN DEGENDT, PETER SNEE, MARC HEYNS, PAUL MERTENS, MARC MEURIS