Abstract: A read-write mode control method is described in which a waiting time during a reading process can be shortened by conducting a read instruction with auto-precharging in a first circuit part. The first circuit part is separate from a second circuit part used for conducting the write instruction, since a memory controller does not need to insert any wait cycles between a write instruction and an associated activate signal.

Abstract: A memory chip with a short data access time limits the propagation time of a bit on local data line strips which are far away from output amplifiers by centering switches with respect to a center of the cell array strips, wherein the switches are junction points between local data lines and main data lines.

Abstract: The memory has a bidirectional address counting unit C1; S, which performs a counting operation for the purpose of generating internal column addresses from an external column address A7 . . . 0. In this case, the counting direction is dependent on the burst operating mode and on an address bit A1 of the external column address. Moreover, the memory has a transformation unit C2; SR2, which forwards partial addresses A2 . . . 1′; PA3 . . . 0′ generated by the address counting unit C1; S either unchanged or incremented by the value 1 to the second column decoder CDEC2, in a manner dependent on the burst operating mode and a further address bit A0 of the external column address A7 . . . 0.

Abstract: The invention describes a memory configuration having a matrix memory in which an evaluation circuit is provided which, when selecting column lines, takes into account which physical row line is being driven.

Abstract: Each redundant unit of an integrated memory device is assigned respective programmable elements, comparison units, a code converting unit, a logic unit and a multiplexer. Each multiplexer has a first switching state, in which it connects outputs of the first comparison units to first inputs of the logic unit, and a second switching state, in which it connects outputs of the code converting unit to the first inputs of the logic unit. In the second switching state of the multiplexers, each redundant unit is assigned a different address in the unprogrammed state of the programmable elements. Therefore, redundant units can be selected individually for test purposes.

Abstract: A memory has data lines through which data connections are connected to groups of memory cells via a synchronizing unit. The synchronizing unit is disposed adjacent to the cell group and has a clock input to which an internal clock signal is fed. In the event of a write access to the memory, the synchronizing unit synchronizes with the internal clock signal data signals that are fed via the data connections and are synchronous with an external clock signal.

Abstract: A memory has an input circuit, which is provided adjacent to two groups of memory cells and via which two global data lines are connected to two local data lines. The memory has two operating states during which it feeds the data provided on the global data lines in respective different assignments to the two local data lines.

Abstract: An integrated memory has first control lines, which run in the direction of bit lines, and a second control line, which runs in the direction of word lines. First control inputs of in each case at least two switching elements that are connected to different sense amplifiers are connected to the same first control line. The second control inputs of the switching elements are connected to the second control line. The invention makes it possible to reduce the number of first control lines running in the direction of the bit lines.

Abstract: The integrated memory has a column decoder for decoding column addresses and for addressing corresponding bit lines. The memory also has a first column address bus, which is used to transfer first column addresses to the column decoder, and a second column address bus, which is used to transfer second column addresses to the column decoder. The column decoder in each case addresses bit lines which correspond to the first and second column addresses supplied to it.

Abstract: In a semiconductor memory, bit lines are disposed in such a way that in each case two inverted and two non-inverted bit lines lie next to one another. Adjacent switching transistors for connecting the bit lines to an inverted or a non-inverted collective line are connected to the corresponding collective line by a common contact. An advantage in terms of area is afforded by the fact that the two switching transistors have a common doping region.

Abstract: The integrated memory has a data line pair, which is connected to a bit line pair via at least one differential amplifier. In addition, it has a control unit for setting first potential states on the data line pair which correspond to the differential signals of data to be written to the memory cells, and for setting at least one second potential state on the data line pair which does not correspond to any datum to be written to the memory cells. Furthermore, it has a detector unit having two inputs connected to the data line pair. The detector unit initiates a specific control function when the second potential state of the data line pair occurs.

Abstract: The integrated memory has byte selection lines for selecting all the bit lines of a respective byte, as well as masking signals that are allocated to the respective byte of at least one word. In addition, the memory has a column decoder with outputs which are connected to the word selection lines, each of which, when addressed, causes all the byte selection lines for one of the words to be simultaneously selected if none of the masking signals are active. The masking signals, when activated, prevent the addressed word selection line from selecting the byte selection lines, allocated to a corresponding byte, for a corresponding word.

Abstract: A method of producing an aluminum film on a substrate, from which very narrow aluminum conductor tracks can be created that are highly resistant to electromigration and/or stress migration. The substrate with the polycrystalline aluminum film is cooled in an oven in a controlled fashion from a target temperature to a final temperature such that energetically stable Al.sub.2 Cu-.theta.-phases are formed directly among the individual aluminum grains in the aluminum film. The cooling is controlled such that the instantaneous temperature passes through a predetermined temperature profile. Within the range of 320.degree. C. to 200.degree. C., the cooling gradient is less than 6.degree. C. per hour.