Abstract: In a method for testing an electric circuit comprising circuit subunits, the electric circuit is connected to a test system via a tester channel with a connection unit. The tester channel is connected to the circuit subunits by means of a connecting unit, test signals are generated for the electric circuit and response signals generated by the electric circuit in response to the test signals are evaluated. The test signals and the response signals are interchanged between the circuit subunits by means of at least one compression/decompression unit associated with at least one of the circuit subunits.

Abstract: An electronic test apparatus for testing at least one circuit unit comprises a clock signal generator for generating a clock signal, a driver device comprising a plurality of driver subunits each generating a phase-shifted driver signal in response to said clock signal, a processing device for processing the phase-shifted driver signals and for comparing actual data being output by at least one circuit unit with desired data generated in the processing device, a connecting device for connecting the processing device to the at least one circuit unit and for transmitting the phase-shifted driver signals, the desired data, and the actual data between the processing device and the at least one circuit unit, and a combinational logic device for combining the phase-shifted driver signals to form a clock combination signal.

Abstract: In a method for testing an electric circuit comprising circuit subunits, the electric circuit is connected to a test system via a tester channel with a connection unit. The tester channel is connected to the circuit subunits by means of a connecting unit, test signals are generated for the electric circuit and response signals generated by the electric circuit in response to the test signals are evaluated. The test signals and the response signals are interchanged between the circuit subunits by means of at least one compression/decompression unit associated with at least one of the circuit subunits.

Abstract: An electronic circuit comprises a volatile memory unit and a non-volatile memory unit which stores a repair information related to the volatile memory unit. The non-volatile and volatile memory units are connected together by a connecting device and are formed as a single electronic module.