Abstract: Disclosed herein are a spectrometer device, a method for measuring optical radiation, and a spectrometer system including the spectrometer device. The spectrometer device includes at least one radiation emitting element, at least one photosensitive detector, at least one control circuit, and at least one readout circuit. The spectrometer system is a mixed spectrometer which employs the advantages of a scanning spectrometer and a dispersive spectrometer. Compared to both, the mixed spectrometer constitutes a simplified spectrometer system by including a reduced number of required components and exhibiting a miniaturized mechanical set-up.

Abstract: Disclosed herein is a device including at least one photoconductor configured for exhibiting an electrical resistance Rphoto dependent on an illumination of a light-sensitive region of the photoconductor; and at least one photoconductor readout circuit, where the photoconductor readout circuit is configured for determining the electrical resistance Rphoto of the photoconductor, where the photoconductor readout circuit includes at least one bias voltage source configured for applying at least one modulated bias voltage to the photoconductor.

Abstract: Described herein is a method and a device for monitoring radiation emitted by a radiation emitting element of a thermal radiation source within the visible and the infrared spectral ranges, specifically for determining an emission spectrum of the thermal radiation source. The method includes the following steps: a) providing a thermal radiation source including a radiation emitting element; b) providing at least one radiation sensitive element; c) measuring a spectral radiance of the radiation emitted by the radiation emitting element at at least two individual wavelengths; and d) determining an emission temperature of the radiation emitting element by providing a ratio of the measured values of the spectral radiance of the radiation at the at least two individual wavelengths.