Patents by Inventor Stefan Jochem THIEME-MARTI

Stefan Jochem THIEME-MARTI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9833636
    Abstract: A radiation device directs a beam of radiation onto a target. The beam can be adjusted using, for example, a control for setting beam shape and a control for setting beam intensity. The target is supported on a surface that can be adjusted using, for example, a control for setting surface position and a control for setting a speed for moving the surface. Controls are selected to adjust the beam and the surface cooperatively in order to compensate for movement of the target.
    Type: Grant
    Filed: September 13, 2012
    Date of Patent: December 5, 2017
    Assignees: Varian Medical Systems, Inc., Varian Medical Systems International AG
    Inventors: Matthias Oster, Herbert Cattell, Qingxiang Ke, Stefan Jochem Thieme-Marti, Michelle Marie Svatos, Andres Graf
  • Patent number: 9091391
    Abstract: A motion platform includes a base, a platform, and a suspension supporting the platform above the base. Strings preload the platform toward the base while the suspension pushes the platform away from the base. Actuators pull and release the strings to manipulate the platform in multiple degrees of freedom.
    Type: Grant
    Filed: October 1, 2010
    Date of Patent: July 28, 2015
    Assignee: Varian Medical Systems International AG
    Inventor: Stefan Jochem Thieme-Marti
  • Patent number: 8983165
    Abstract: The claimed subject matter describes a novel technique to measure the beam profile using an area detector. In one embodiment, a set of one-dimensional beam profile measurements is performed by taking two images under the same source conditions but at two different positions of the detector, with each position of the detector shifted by a certain distance in the direction corresponding to the direction of the one-dimensional profile measurement. In further embodiments, a set of two-dimensional beam profile measurements is achieved by determining a second set of one-dimensional profiles from the same sampling points in a second direction and building a two-dimensional map of the beam profile by correlating the first one-dimensional profile measurement with the second one-dimensional profile measurement.
    Type: Grant
    Filed: March 23, 2011
    Date of Patent: March 17, 2015
    Assignee: Varian Medical Systems, Inc.
    Inventors: Mingshan Sun, Josh Star-Lack, Gary Virshup, Daniel Morf, Stefan Jochem Thieme-Marti
  • Publication number: 20140070115
    Abstract: A radiation device directs a beam of radiation onto a target. The beam can be adjusted using, for example, a control for setting beam shape and a control for setting beam intensity. The target is supported on a surface that can be adjusted using, for example, a control for setting surface position and a control for setting a speed for moving the surface. Controls are selected to adjust the beam and the surface cooperatively in order to compensate for movement of the target.
    Type: Application
    Filed: September 13, 2012
    Publication date: March 13, 2014
    Inventors: Matthias OSTER, Herbert CATTELL, Qingxiang KE, Stefan Jochem THIEME-MARTI, Michelle Marie SVATOS, Andres GRAF
  • Publication number: 20120080578
    Abstract: A motion platform includes a base, a platform, and a suspension supporting the platform above the base. Strings preload the platform toward the base while the suspension pushes the platform away from the base. Actuators pull and release the strings to manipulate the platform in multiple degrees of freedom.
    Type: Application
    Filed: October 1, 2010
    Publication date: April 5, 2012
    Applicant: VARIAN MEDICAL SYSTEMS INTERNATIONAL AG
    Inventor: Stefan Jochem Thieme-Marti
  • Publication number: 20120014618
    Abstract: The claimed subject matter describes a novel technique to measure the beam profile using an area detector. In one embodiment, a set of one-dimensional beam profile measurements is performed by taking two images under the same source conditions but at two different positions of the detector, with each position of the detector shifted by a certain distance in the direction corresponding to the direction of the one-dimensional profile measurement. In further embodiments, a set of two-dimensional beam profile measurements is achieved by determining a second set of one-dimensional profiles from the same sampling points in a second direction and building a two-dimensional map of the beam profile by correlating the first one-dimensional profile measurement with the second one-dimensional profile measurement.
    Type: Application
    Filed: March 23, 2011
    Publication date: January 19, 2012
    Inventors: Mingshan SUN, Josh STAR-LACK, Gary VIRSHUP, Daniel MORF, Stefan Jochem THIEME-MARTI