Abstract: A method for optically inspecting a surface (10) of an object (1) and an inspection device (9) are described. With the method a temporally periodic pattern (13) with different illumination patterns (130) is generated on the surface (10) by means of a illumination device (8) of the inspection device (9) during an image recording sequence (13), and in the image recording sequence a number of images of the pattern (13) on the surface (10) are recorded by means of an image recording device (7) of the inspection device (9), wherein generating one of the different illumination patterns (130) is synchronised, respectively, with the image recording of one of the images of the pattern (13), the phase of the pattern (13) is determined from the succession of the recorded known illumination patterns (130) in at least one image point and defects (4, 5) on the surface (10) are detected from deviations of the recorded illumination pattern (130) from the generated known illumination pattern (130).

Abstract: The invention relates to device for measuring the thickness of a transparent sample (2), particularly a glass strip or a glass pane, involving the use of: a first light beam (L1), particularly a first laser beam, which strikes upon the front surface (8) of the sample (2) at a first angle of incidence (?1); a second light beam (L2), particularly a second laser beam, which strikes upon the front surface (8) of the sample (2) at a second angle of incidence (?2), the first angle of incidence (?1) and the second angle of incidence (?2) being different, and; at least one detector (11, 12) for detecting the light beams (L1?, L1?, L2?, L2?) of the first and second incident light beams (L1, L2) reflected by the sample, and for determining the position thereof.

Abstract: The invention relates to device for measuring the thickness of a transparent sample (2), particularly a glass strip or a glass pane, involving the use of: a first light beam (L1), particularly a first laser beam, which strikes upon the front surface (8) of the sample (2) at a first angle of incidence (?1); a second light beam (L2), particularly a second laser beam, which strikes upon the front surface (8) of the sample (2) at a second angle of incidence (?2), the first angle of incidence (?1) and the second angle of incidence (?2) being different, and; at least one detector (11, 12) for detecting the light beams (L1?, L1?, L2?, L2?) of the first and second incident light beams (L1, L2) reflected by the sample, and for determining the position thereof.