Patents by Inventor Stefan Othmar POULSEN

Stefan Othmar POULSEN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus
    Patent number: 9222901
    Abstract: An X-ray diffraction method of mapping grain structures in a polycrystalline material sample, where an X-ray detector detects spots or line-shaped segments from beams diffracted from at least some of the grains. A processing device analyzes values received from the X-ray detector and identifies at least the position of the spots or line-shaped segments. The processing device discretizes an initial three-dimensional model of the polycrystalline material sample into voxels and reconstructs the grains in the model by iterative testing associating crystallographic orientations of the voxels to the detected spots or line-shaped segments.
    Type: Grant
    Filed: March 5, 2014
    Date of Patent: December 29, 2015
    Assignees: Danmarks Tekniske Universitet Anker Engelundsvej, CARL ZEISS X-RAY MICROSCOPY, INC.
    Inventors: Erik Mejdal Lauridsen, Stefan Othmar Poulsen, Peter Reischig
  • X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus
    Patent number: 9222900
    Abstract: An X-ray diffraction method of mapping grain structures in a polycrystalline material sample, where an X-ray detector detects substantially line-shaped segments from beams diffracted from at least some of the grains. A processing device analyzes values received from the X-ray detector and identifies at least the position and the length of the line-shaped segments. The line-shaped segments are paired as originating from diffractions from the same grain and the positions of the paired line-shaped segments are used in determining the crystallographic grain position of this grain within in the polycrystalline material sample. The length of the paired line-shaped segments is used in determining a width of this grain.
    Type: Grant
    Filed: March 5, 2013
    Date of Patent: December 29, 2015
    Assignee: Danmarks Tekniske Universitet of Anker Engelundsvej
    Inventors: Erik Mejdal Lauridsen, Stefan Othmar Poulsen, Christian Holzner, Michael Feser
  • X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLINE MATERIAL SAMPLE, AND AN X-RAY DIFFRACTION APPARATUS
    Publication number: 20140307854
    Abstract: An X-ray diffraction method of mapping grain structures in a polycrystalline material sample, where an X-ray detector detects spots or line-shaped segments from beams diffracted from at least some of the grains. A processing device analyses values received from the X-ray detector and identifies at least the position of the spots or line-shaped segments. The processing device discretizes an initial three-dimensional model of the polycrystalline material sample into voxels and reconstructs the grains in the model by iterative testing associating crystallographic orientations of the voxels to the detected spots or line-shaped segments.
    Type: Application
    Filed: March 5, 2014
    Publication date: October 16, 2014
    Applicants: CARL ZEISS X-RAY MICROSCOPY, INC., DANMARKS TEKNISKE UNIVERSITET
    Inventors: Erik Mejdal LAURIDSEN, Stefan Othmar POULSEN, Péter REISCHIG
  • X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLINE MATERIAL SAMPLE, AND AN X-RAY DIFFRACTION APPARATUS
    Publication number: 20140254763
    Abstract: An X-ray diffraction method of mapping grain structures in a polycrystalline material sample, where an X-ray detector detects substantially line-shaped segments from beams diffracted from at least some of the grains. A processing device analyses values received from the X-ray detector and identifies at least the position and the length of the line-shaped segments. The line-shaped segments are paired as originating from diffractions from the same grain and the positions of the paired line-shaped segments are used in determining the crystallographic grain position of this grain within in the polycrystalline material sample. The length of the paired line-shaped segments is used in determining a width of this grain.
    Type: Application
    Filed: March 5, 2013
    Publication date: September 11, 2014
    Applicant: DANMARKS TEKNISKE UNIVERSITET
    Inventors: Erik Mejdal LAURIDSEN, Stefan Othmar POULSEN