Abstract: The present invention relates to a storage device (1) for storing cryogenic samples (2), comprising at least one sample holder (3), the sample holder being configured to hold at least one cryogenic sample (2). According to the present invention, the storage device (1) further comprises an elongated sample transport unit (4) configured to releasably hold the at least one sample holder (3) and to be inserted into an internal space (50) of a cryogenic storage dewar (5) through an opening (51) of the cryogenic storage dewar to completely submerge the sample transport unit into a cryogenic liquid (6) residing in the internal space, wherein the sample transport unit is further configured to move said at least one sample holder along a predefined path from a storage position into a removal position, from which the at least one sample holder can be removed from the internal space of the cryogenic storage dewar.

Abstract: The invention relates to a device (100) for reducing ice contamination of a sample (S) in a chamber (210) of a focused ion beam milling apparatus (200), wherein the device (100) comprises a body (110) configured to be cooled to cryogenic temperatures, wherein the body (110) comprises an aperture (111), which is configured such that an ion beam (I) generated by an ion source (220) can pass from the ion source (220) through the aperture (111) to the sample (S), wherein the body (110) comprises a recess (112), wherein said aperture (111) is arranged in the recess (112). The invention further relates to a focused ion beam milling apparatus (200) and a method for focused ion beam milling of a sample (S).

Abstract: The invention relates to a workstation (1), a preparation station (2) and a method for manipulating an electron microscopy grid assembly (3). The workstation (1) comprises a first compartment (101), a first gas inlet (102) for generating an overpressure in the first compartment (101), a first glove (104) and a second glove (105), each being fixed in a respective opening (106, 107) of the workstation (1), wherein the first glove (104) and the second glove (105) are movable in the first compartment (101) to manipulate objects in the first compartment (101), wherein the workstation (1) comprises a port (109) for providing a transfer device (4) for an electron microscopy grid assembly (3) in the first compartment (101).