Abstract: A method for each of a plurality of satellites of a secondary Global Navigation Satellite System, GNSS, in a Low Earth Orbit, LEO, comprising receiving GNSS signals, in a first frequency band, from Line-Of-Sight, LOS, satellites of at least one primary GNSS in a Medium Earth Orbit. Candidate sets of orbit and clock corrections for the LOS satellites are received. A Position-Velocity-Time, PVT, calculation is performed based on code and/or carrier pseudo-ranges between a respective satellite of the secondary GNSS and the LOS satellites. The code and/or carrier pseudo-ranges are derived from the GNSS signals and are corrected by a single set of the candidate sets. A short-term prediction model is determined for an orbit and clock of the respective satellite based on the PVT and is included in a navigation message, transmitted in a second frequency band, modulated onto a LEO navigation signal intended for terrestrial user equipment.

Abstract: A method for each of a plurality of satellites of a secondary Global Navigation Satellite System, GNSS, in a Low Earth Orbit, LEO, comprising receiving GNSS signals, in a first frequency band, from Line-Of-Sight, LOS, satellites of at least one primary GNSS in a Medium Earth Orbit. Candidate sets of orbit and clock corrections for the LOS satellites are received. A Position-Velocity-Time, PVT, calculation is performed based on code and/or carrier pseudo-ranges between a respective satellite of the secondary GNSS and the LOS satellites. The code and/or carrier pseudo-ranges are derived from the GNSS signals and are corrected by a single set of the candidate sets. A short-term prediction model is determined for an orbit and clock of the respective satellite based on the PVT and is included in a navigation message, transmitted in a second frequency band, modulated onto a LEO navigation signal intended for terrestrial user equipment.

Abstract: A micromechanical inertial sensor that includes three component planes, namely a bottom part, a center part and a cover part. The center part is a silicon wafer in which a cardan-type (i.e. gimbal) structure with two oscillating elements is formed. A plate is formed in the silicon wafer which can be pivoted about a rotational axis lying in the wafer plane. Metallized portions or conductive layers form an exciter unit and set the gimbal structure oscillating. The inventive sensor further comprises a device for detecting the displacement of the plate. In addition, a method for manufacturing a micromechanical inertial sensor.

Abstract: A micromechanical rotation speed sensor with a gimbals-mounted structure capable of vibration includes two vibration elements (4, 5) which are swivelled about two axes (A, B) oriented perpendicular toward each other. An excitation unit in the form of an electrode (7) sets the first vibration element (4) into a vibration about the first axis of rotation (A). A read out unit in the form of a read out electrode (8) records a tipping or vibration of the second vibration element (5) about the second axis of rotation (B) as a measure for the rotation speed of the sensor. Additional mass elements (6a, 6b) which are symmetrically aligned are situated on the upper side (2a) and the underside (2b) of the first vibration element (4) which form a rocker. The sensor is manufactured of at least three individually processed wafers which are finally joined together and form a top part (1), a midsection (2) and a bottom part (3).

Abstract: The invention relates to a micromechanical inertial sensor that comprises three component planes, namely a bottom part (12), a center part (11) and a cover part (13). The center part (11) is a silicon wafer in which a cardan-type structure (14) with two oscillating elements (15, 16) is formed. A plate (17, 18) is formed in the silicon wafer which can be pivoted about a rotational axis lying in the wafer plane. Metallized portions or conductive layers (19, 20, 21, 22) form an exciter unit and set the cardan-type structure oscillating. The inventive sensor further comprises a device for detecting the displacement of the plate (17, 18). Said structures represent a sensor module with a rotational rate sensor and at least one acceleration sensor that are produced by means of the same method.

Abstract: A micromechanical rotation speed sensor with a gimbals-mounted structure capable of vibration includes two vibration elements (4, 5) which are swivelled about two axes (A, B) oriented perpendicular toward each other. An excitation unit in the form of an electrode (7) sets the first vibration element (4) into a vibration about the first axis of rotation (A). A read out unit in the form of a read out electrode (8) records a tipping or vibration of the second vibration element (5) about the second axis of rotation (B) as a measure for the rotation speed of the sensor. Additional mass elements (6a, 6b) which are symmetrically aligned are situated on the upper side (2a) and the underside (2b) of the first vibration element (4) which form a rocker. The sensor is manufactured of at least three individually processed wafers which are finally joined together and form a top part (1), a midsection (2) and a bottom part (3).

Abstract: A device for determining the frequency and/or the amplitude of a vibrating structure includes a vibrating element (2) and a pair of position sensors (10, 11) for the determination of the deflection of the vibrating element (2). The position sensors (10, 11) are arranged such that their measurements during a half-wave of vibration exceed and/or are less than one another. A comparator compares the measurements of the two position sensors (10, 11) to determine a threshold value Us for the half-wave of the vibration at which their measurements are equal. A device is used for determining the duration during which the measurement of one of the two position sensors (10, 11) exceeds or is less than the threshold value Us. The position sensors (10, 11) can be capacitors whose electrodes are arranged in a step-like manner. The determination of the amplitude of the vibration is, carried out independent of a potential parallel shift of the movable element (2), such that there is no distortion of the measurement result.