Abstract: A test system for testing a device under test is described. The test system includes an anechoic chamber for encompassing a device under test to be tested by means of radio frequency radiation. The anechoic chamber has a wall with an opening provided in the wall. The test system also has a feedthrough assembly for transporting a fluid into the anechoic chamber or from the anechoic chamber. The feedthrough assembly has a pipe that extends through the opening such that the pipe is fed through the opening. The pipe is routed such that radio frequency radiation is prevented from leaving the anechoic chamber via the pipe. Furthermore, a feedthrough assembly is described.

Abstract: An over the air, OTA, test chamber for testing at least one device under test, DUT, provided within the OTA test chamber which includes a thermal bubble component adapted to receive the device under test, DUT, comprising an air inlet adapted to supply air into the thermal bubble component, an air outlet adapted to remove air from the thermal bubble component and an airstream diffusor provided at the air inlet and adapted to diffuse an airstream supplied by the air inlet within the thermal bubble component.

Abstract: A test system for testing a device under test is described. The test system includes an anechoic chamber for encompassing a device under test to be tested by means of radio frequency radiation. The anechoic chamber has a wall with an opening provided in the wall. The test system also has a feedthrough assembly for transporting a fluid into the anechoic chamber or from the anechoic chamber. The feedthrough assembly has a pipe that extends through the opening such that the pipe is fed through the opening. The pipe is routed such that radio frequency radiation is prevented from leaving the anechoic chamber via the pipe. Furthermore, a feedthrough assembly is described.