Abstract: The present disclosure relates to a modular positioner and/or fixture, a measurement system and a data processing program product for a device under test (DUT), comprising a first positioning and/or fixing connector, adapted for being detachably mounted to a DUT, a second positioning and/or fixing connector for mounting to a test arrangement, the first positioning and/or fixing connector and second positioning and/or fixing connector being adapted to automatically interact with each other to provide a positioning and/or fixing of a DUT by automatically effecting a positive form-fit interaction and/or for non-positive force-fit interaction, further comprising elongated guiding elements, adapted for guiding the first positioning and/or fixing connector into a fixing position with respect to the second positioning and/or fixing connector.

Abstract: The present invention relates to a positioning apparatus for positioning a device under test—DUT—, the positioning apparatus comprising: a support structure extending over an horizontal plane, and a mast structure, which is elongated in shape and configured to contact the support structure, wherein the mast structure is movable along a pivoting axis between a first position, where the mast structure is perpendicular to the horizontal plane, and a second position, where the mast structure is parallel to the horizontal plane.

Abstract: An over the air, OTA, test chamber for testing at least one device under test, DUT, provided within the OTA test chamber which includes a thermal bubble component adapted to receive the device under test, DUT, comprising an air inlet adapted to supply air into the thermal bubble component, an air outlet adapted to remove air from the thermal bubble component and an airstream diffusor provided at the air inlet and adapted to diffuse an airstream supplied by the air inlet within the thermal bubble component.

Abstract: A test system for testing a device under test is described. The test system includes an anechoic chamber for encompassing a device under test to be tested by means of radio frequency radiation. The anechoic chamber has a wall with an opening provided in the wall. The test system also has a feedthrough assembly for transporting a fluid into the anechoic chamber or from the anechoic chamber. The feedthrough assembly has a pipe that extends through the opening such that the pipe is fed through the opening. The pipe is routed such that radio frequency radiation is prevented from leaving the anechoic chamber via the pipe. Furthermore, a feedthrough assembly is described.

Abstract: An over the air, OTA, test chamber for testing at least one device under test, DUT, provided within the OTA test chamber which includes a thermal bubble component adapted to receive the device under test, DUT, comprising an air inlet adapted to supply air into the thermal bubble component, an air outlet adapted to remove air from the thermal bubble component and an airstream diffusor provided at the air inlet and adapted to diffuse an airstream supplied by the air inlet within the thermal bubble component.

Abstract: A test system for testing a device under test is described. The test system includes an anechoic chamber for encompassing a device under test to be tested by means of radio frequency radiation. The anechoic chamber has a wall with an opening provided in the wall. The test system also has a feedthrough assembly for transporting a fluid into the anechoic chamber or from the anechoic chamber. The feedthrough assembly has a pipe that extends through the opening such that the pipe is fed through the opening. The pipe is routed such that radio frequency radiation is prevented from leaving the anechoic chamber via the pipe. Furthermore, a feedthrough assembly is described.