Abstract: A method and system for comparing network configuration data stored in a wireless communication network with parameters that depend on the physical configuration of the network is provided. Subscriber wireless communication devices operating in the network provide measurement data. From the measurement data, at least one first parameter is selected or derived, the first parameter depending on the physical configuration of the network. From network configuration data stored in the wireless communication network, at least one second parameter that corresponds to the at least one first parameter is selected. Any discrepancy between the values of the first and second parameters is then identified. Analysis of the discrepancies may reveal errors or omissions in the stored network configuration data, such as missing entries in the neighbors table for a cell site. Faults in the physical network may also be revealed.

Abstract: The invention relates to a handler for electronic components, in particular IC's, having a plurality of circulating carriages (10) that are guided along their circulating track by means of a stationary, annular guide device (9) consisting of at least one circulating guide rail. Retaining units (12) are provided on the circulating carriages (10), said units retaining the components (43) to be tested.

Abstract: A plunger for holding and moving electrical components in particular IC's to and from a contacting device connected to a test bed, comprises a head piece with a fluid distribution chamber through which temperature-controlled fluid flows. A suction head is arranged such that the temperature-controlled fluid flows around the suction head and is diverted along the suction head to the component.

Abstract: A handler for electronic components, in particular IC's, for controlling the temperature of the components and supplying and removing said components to and from a test device has circulating units that can be moved along a circulating track. Each unit has at least one retaining unit for retaining a component. In addition, the circulating units have temperature-control chambers containing components that are retained by the retaining units, so that the temperature of the components can be controlled during transport from the charging station to the test station.

Abstract: A handler for electronic components, in particular IC's, for controlling the temperature of the components and supplying and removing said components to and from a test device has circulating units that can be moved along a circulating track. Each unit has at least one retaining unit for retaining a component. In addition, the circulating units have temperature-control chambers containing components that are retained by the retaining units, so that the temperature of the components can be controlled during transport from the charging station to the test station.

Abstract: A plunger for holding and moving electrical components in particular IC's to and from a contacting device connected to a test bed, comprises a head piece with a fluid distribution chamber through which temperature-controlled fluid flows. A suction head is arranged such that the temperature-controlled fluid flows around the suction head and is diverted along the suction head to the component.

Abstract: The invention relates to a handler for electronic components, in particular IC's, having a plurality of circulating carriages (10) that are guided along their circulating track by means of a stationary, annular guide device (9) consisting of at least one circulating guide rail. Retaining units (12) are provided on the circulating carriages (10), said units retaining the components (43) to be tested.

Abstract: A handler for electronic components, in particular IC's, comprising a feed unit for plungers with a pneumatic cylinder unit that can be displaced and that is coupled to a pneumatic cylinder displacement unit, which moves said cylinder unit back and forth in the axial direction of the plungers.