Patents by Inventor Stefanie Belgard

Stefanie Belgard has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray analysis instrument with adjustable aperture window
    Patent number: 7983388
    Abstract: An X-ray analysis instrument, in particular, an X-ray diffractometer (21), has an X-ray source (22; SC) that emits an X-ray beam (23), an X-ray optics (24), in particular a multi-layer X-ray mirror, and a collimator mechanism (BM), wherein the collimator mechanism (BM) forms an aperture window (2, 2?) with an aperture opening (3, 3?) through which at least part (26) of the X-ray beam (23) passes.
    Type: Grant
    Filed: August 26, 2009
    Date of Patent: July 19, 2011
    Assignee: incoatec GmbH
    Inventors: Carsten Michaelsen, Stefanie Belgard, Juergen Graf
  • X-ray analysis instrument with adjustable aperture window
    Publication number: 20100086104
    Abstract: An X-ray analysis instrument, in particular, an X-ray diffractometer (21), has an X-ray source (22; SC) that emits an X-ray beam (23), an X-ray optics (24), in particular a multi-layer X-ray mirror, and a collimator mechanism (BM), wherein the collimator mechanism (BM) forms an aperture window (2, 2?) with an aperture opening (3, 3?) through which at least part (26) of the X-ray beam (23) passes.
    Type: Application
    Filed: August 26, 2009
    Publication date: April 8, 2010
    Applicant: incoatec GmbH
    Inventors: Carsten Michaelsen, Stefanie Belgard, Juergen Graf