Patents by Inventor Stefanie Schatt

Stefanie Schatt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Circuit configuration for measuring the capacitance of structures in an integrated circuit
    Patent number: 6501283
    Abstract: A circuit configuration for measuring the capacitance of structures in an integrated circuit having a test structure and a reference structure, includes first and second series circuits, each having two transistors connected in series and connected in parallel between supply terminals each providing one supply potential. The test structure is connected to a coupling node of the transistors of the first series circuit. The reference structure is connected to a coupling node of the transistors of the second series circuit. The supply terminals of the series circuits are connected to a controllable voltage source. A voltage-dependent differential capacitance measurement can be carried out on the test structure by using the circuit configuration.
    Type: Grant
    Filed: January 16, 2001
    Date of Patent: December 31, 2002
    Assignee: Infineon Technologies AG
    Inventors: Jürgen Lindolf, Stefanie Schatt
  • Circuit configuration for measuring the capacitance of structures in an integrated circuit
    Publication number: 20010033177
    Abstract: A circuit configuration for measuring the capacitance of structures in an integrated circuit having a test structure and a reference structure, includes first and second series circuits, each having two transistors connected in series and connected in parallel between supply terminals each providing one supply potential. The test structure is connected to a coupling node of the transistors of the first series circuit. The reference structure is connected to a coupling node of the transistors of the second series circuit. The supply terminals of the series circuits are connected to a controllable voltage source. A voltage-dependent differential capacitance measurement can be carried out on the test structure by using the circuit configuration.
    Type: Application
    Filed: January 16, 2001
    Publication date: October 25, 2001
    Inventors: Jurgen Lindolf, Stefanie Schatt