Patents by Inventor Stefano Concina

Stefano Concina has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems and Methods for Determining One or More Characteristics of a Specimen Using Radiation in the Terahertz Range
    Publication number: 20120281275
    Abstract: Systems and methods for determining one or more characteristics of a specimen using radiation in the terahertz range are provided. One system includes an illumination subsystem configured to illuminate the specimen with radiation. The system also includes a detection subsystem configured to detect radiation propagating from the specimen in response to illumination of the specimen and to generate output responsive to the detected radiation. The detected radiation includes radiation in the terahertz range. In addition, the system includes a processor configured to determine the one or more characteristics of the specimen using the output.
    Type: Application
    Filed: July 19, 2012
    Publication date: November 8, 2012
    Applicant: KLA-TENCOR CORPORATION
    Inventors: Ady Levy, Samuel Ngai, Christopher F. Bevis, Stefano Concina, John Fielden, Walter Mieher, Dieter Mueller, Neil Richardson, Dan Wack, Larry Wagner
  • SYSTEMS AND METHODS FOR DETERMINING ONE OR MORE CHARACTERISTICS OF A SPECIMEN USING RADIATION IN THE TERAHERTZ RANGE
    Publication number: 20100235114
    Abstract: Systems and methods for determining one or more characteristics of a specimen using radiation in the terahertz range are provided. One system includes an illumination subsystem configured to illuminate the specimen with radiation. The system also includes a detection subsystem configured to detect radiation propagating from the specimen in response to illumination of the specimen and to generate output responsive to the detected radiation. The detected radiation includes radiation in the terahertz range. In addition, the system includes a processor configured to determine the one or more characteristics of the specimen using the output.
    Type: Application
    Filed: March 10, 2009
    Publication date: September 16, 2010
    Applicant: KLA-TENCOR CORPORATION
    Inventors: Ady Levy, Samuel Ngai, Christopher F. Bevis, Stefano Concina, John Fielden, Walter Mieher, Dieter Mueller, Neil Richardson, Dan Wack, Larry Wagner