Abstract: A method for improving the intermediate dielectric profile, particularly for non-volatile memories constituted by a plurality of cells, including the following steps: forming field oxide regions and drain active area regions on a substrate; forming word lines on the field oxide regions; depositing oxide to form oxide wings that are adjacent to the word lines; opening, by masking, source regions and the drain active area regions, keeping the field oxide regions that separate one memory cell from the other, inside the memory, covered with resist; and removing field oxide in the source regions and removing oxide wings from both sides of the word lines.

Abstract: The method described provides for the formation of an implantation mask of polycrystalline silicon comprising strips for providing the gate electrodes of the MOS transistors and portions defining openings for the formation of resistors. The method further includes low-dose ionic implantation through the implantation mask to form pairs of regions at the sides of the gate strips and resistive regions through the openings, the formation of an insulating layer on the entire structure thus produced, and anisotropic etching of the insulating layer so as to uncover the areas of the substrate not covered by the polycrystalline silicon mask, but leaving a residue of insulating material along the edges of the gate strips.

Abstract: A method for improving the intermediate dielectric profile, particularly for non-volatile memories constituted by a plurality of cells, including the following steps: forming field oxide regions and drain active area regions on a substrate; forming word lines on the field oxide regions; depositing oxide to form oxide wings that are adjacent to the word lines; opening, by masking, source regions and the drain active area regions, keeping the field oxide regions that separate one memory cell from the other, inside the memory, covered with resist; and removing field oxide in the source regions and removing oxide wings from both sides of the word lines.