Abstract: An apparatus for performing multi-tier domain pre-characterization for floating random walk capacitance extraction of a semiconductor structure includes a processor configured to recursively execute a floating random walk algorithm, over a plurality of points for a plurality of conductors, to permit determination of a potential at a plurality of points on a Gaussian surface around each of a plurality of conductors and determination of a coupling capacitance between the plurality of conductors, each iteration of the floating random walk algorithm comprising selection of a domain about an initial boundary point on the Gaussian surface of the respective one of the plurality of conductors and determination of a new boundary point on the new domain, from which a successive boundary point is selected with a corresponding successive domain centered thereabout, this process continuing until a corresponding successive domain terminates at a boundary having a known potential, whereupon the processor determines the pote

Abstract: An apparatus for extracting capacitances of arbitrarily oriented three-dimensional interconnects includes a processor configured to recursively execute a floating random walk algorithm over a plurality of points for a plurality of conductors, to permit determination of a potential at a plurality of points on a Gaussian surface around each conductor and determination of a coupling capacitance between each conductor. Each iteration includes selecting an initial domain centered about an initial boundary point on a Gaussian surface of an initial conductor, determining a new boundary point on the initial domain from which a successive domain centered about the new boundary point may be selected, and determining a corresponding successive boundary point on the successive domain, each iteration continuing until the new boundary point or the corresponding successive boundary point terminates on a boundary having a known potential. Each selected domain may be rotated to align with the nearest conductor.

Abstract: A method for designing a circuit element of an integrated circuit (IC) includes receiving one or more desired characteristics of the circuit element from user input and iteratively determining a design solution through one or more simulations and modifications using a rule-set. The one or more desired characteristics are combined with other preset characteristics of the circuit element or the IC. A first model of the circuit element is defined and simulated to calculate performance. The first and subsequent models are modified by drawing on a rule-set of expert knowledge relating to general dependency of at least one design criterion, such as a physical, geometrical or performance characteristic, with another design criterion.

Abstract: An apparatus for extracting capacitances of arbitrarily oriented three-dimensional interconnects includes a processor configured to recursively execute a floating random walk algorithm over a plurality of points for a plurality of conductors, to permit determination of a potential at a plurality of points on a Gaussian surface around each conductor and determination of a coupling capacitance between each conductor. Each iteration includes selecting an initial domain centered about an initial boundary point on a Gaussian surface of an initial conductor, determining a new boundary point on the initial domain from which a successive domain centered about the new boundary point may be selected, and determining a corresponding successive boundary point on the successive domain, each iteration continuing until the new boundary point or the corresponding successive boundary point terminates on a boundary having a known potential. Each selected domain may be rotated to align with the nearest conductor.

Abstract: A method for designing a circuit element of an integrated circuit (IC) includes receiving one or more desired characteristics of the circuit element from user input and iteratively determining a design solution through one or more simulations and modifications using a rule-set. The one or more desired characteristics are combined with other preset characteristics of the circuit element or the IC. A first model of the circuit element is defined and simulated to calculate performance. The first and subsequent models are modified by drawing on a rule-set of expert knowledge relating to general dependency of at least one design criterion, such as a physical, geometrical or performance characteristic, with another design criterion.

Abstract: A method for designing a transformer in an integrated circuit includes receiving one or more desired characteristics of the transformer from user input and iteratively determining a design solution for the transformer through one or more simulations and modifications using a rule-set. The method combines the one or more desired characteristics with other preset characteristics of the transformer or the integrated circuit. A first model of the transformer is defined with typical load impedances and simulated having the combined characteristics to determine performance. Results of the simulation are processed to calculate performance with the load impedances specified by the user. The results are further processed to obtain a mathematical model that includes tuning capacitors.

Abstract: A method for designing a transformer in an integrated circuit includes receiving one or more desired characteristics of the transformer from user input and iteratively determining a design solution for the transformer through one or more simulations and modifications using a rule-set. The method combines the one or more desired characteristics with other preset characteristics of the transformer or the integrated circuit. A first model of the transformer is defined with typical load impedances and simulated having the combined characteristics to determine performance. Results of the simulation are processed to calculate performance with the load impedances specified by the user. The results are further processed to obtain a mathematical model that includes tuning capacitors.