Abstract: Some embodiments relate to a method and a corresponding apparatus for estimating the wear of a non-volatile memory. Such a method may include determining a load profile with respect to a real access load occurring during a defined test period where the load profile indicates a respectively associated access load for accesses to a first NVM, and generating access data representing the determined load profile. The method further includes determining an estimated value for the wear of a particular second NVM in part on the basis of the access data.

Abstract: Some embodiments relate to a method and a corresponding apparatus for estimating the wear of a non-volatile memory. Such a method may include determining a load profile with respect to a real access load occurring during a defined test period where the load profile indicates a respectively associated access load for accesses to a first NVM, and generating access data representing the determined load profile. The method further includes determining an estimated value for the wear of a particular second NVM in part on the basis of the access data.

Abstract: An apparatus and a method for correcting data errors in a data block. The data block contains original data which are supplemented by such a security syndrome that the data block effects a correction of at most t data errors, wherein a parallel-operating quick corrector is used. The quick corrector is only designed for a correction of a subset t1 of the set of the at most t data errors, and the quick corrector includes a test encoder, which sets a first test state flag P1 which, in the event of a complete correction of a processed data block, outputs this data block and secondly activates a series-operating post-corrector for at most t data errors. The output signal of the post-corrector is output as an alternative.