Patents by Inventor Steffen Chladek

Steffen Chladek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • LRL vector calibration to the end of the probe needles for non-standard probe cards for ATE RF testers
    Patent number: 7532014
    Abstract: A method and apparatus for radio frequency vector calibration of s-parameter measurements to the tips of the wafer probe needles of an automatic test equipment production tester. The method involves a modified Line-Reflect-Line (LRL) calibration routine that uses a Thru-Reflect-Line to LRL shift to eliminate the need for a precisely characterized reflect standard used during a conventional LRL calibration. The method further involves de-embedding the non-ideal effects of the non-zero length thru standard used during the calibration routine to improve measurement accuracy of the tester. The apparatus may involve the use of RF relays to allow multiple wafer probe needles to share RF test ports.
    Type: Grant
    Filed: August 8, 2006
    Date of Patent: May 12, 2009
    Assignee: Credence Systems Corporation
    Inventors: Steffen Chladek, Martin Breinbauer
  • LRL VECTOR CALIBRATION TO THE END OF THE PROBE NEEDLES FOR NON-STANDARD PROBE CARDS FOR ATE RF TESTERS
    Publication number: 20090051380
    Abstract: A method and apparatus for radio frequency vector calibration of s-parameter measurements to the tips of the wafer probe needles of an automatic test equipment production tester. The method involves a modified Line-Reflect-Line (LRL) calibration routine that uses a Thru-Reflect-Line to LRL shift to eliminate the need for a precisely characterized reflect standard used during a conventional LRL calibration. The method further involves de-embedding the non-ideal effects of the non-zero length thru standard used during the calibration routine to improve measurement accuracy of the tester. The apparatus may involve the use of RF relays to allow multiple wafer probe needles to share RF test ports.
    Type: Application
    Filed: November 3, 2008
    Publication date: February 26, 2009
    Inventors: Steffen Chladek, Martin Breinbauer
  • LRL VECTOR CALIBRATION TO THE END OF THE PROBE NEEDLES FOR NON-STANDARD PROBE CARDS FOR ATE RF TESTERS
    Publication number: 20080036469
    Abstract: A method and apparatus for radio frequency vector calibration of s-parameter measurements to the tips of the wafer probe needles of an automatic test equipment production tester. The method involves a modified Line-Reflect-Line (LRL) calibration routine that uses a Thru-Reflect-Line to LRL shift to eliminate the need for a precisely characterized reflect standard used during a conventional LRL calibration. The method further involves de-embedding the non-ideal effects of the non-zero length thru standard used during the calibration routine to improve measurement accuracy of the tester. The apparatus may involve the use of RF relays to allow multiple wafer probe needles to share RF test ports.
    Type: Application
    Filed: August 8, 2006
    Publication date: February 14, 2008
    Applicant: Credence Systems Corporation
    Inventors: Steffen Chladek, Martin Breinbauer