Patents by Inventor Steffen Gerlach

Steffen Gerlach has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11970169
    Abstract: An antilock control method for a braking system of a vehicle has at least the following steps: upon the presence of a brake request signal, outputting a brake control signal and building up a brake pressure by a braking medium at a wheel brake of a vehicle wheel, measuring a wheel speed of the vehicle wheel to be braked, and determining a wheel slip of the vehicle wheel, upon meeting a first traction criterion or a locking tendency of the vehicle wheel, activating a wheel drive unit and applying a wheel drive torque on the vehicle wheel to increase the wheel circumferential velocity and to reduce the wheel slip until a second traction criterion is met. The brake force introduced in the wheel brake is controlled as a function of the wheel slip by releasing the brake pressure upon satisfying a first traction criterion.
    Type: Grant
    Filed: June 17, 2022
    Date of Patent: April 30, 2024
    Assignee: ZF CV Systems Europe BV
    Inventors: Steffen Gerlach, Alexander Rodenberg, Michael Schomburg
  • Publication number: 20230001910
    Abstract: The disclosure relates to a fluid valve including a lip seal having a sealing lip between a pressure inlet and a pressure outlet, wherein the position of the sealing lip can be varied to vary a passage cross section. The disclosure further relates to a pneumatic valve arrangement having a park release valve and the fluid valve. The disclosure further relates to a pneumatic braking system including the fluid valve or the pneumatic valve arrangement.
    Type: Application
    Filed: August 29, 2022
    Publication date: January 5, 2023
    Inventors: Steffen Gerlach, Karsten-Wilhelm Lüchau, Armin Sieker
  • Publication number: 20220324453
    Abstract: An antilock control method for a braking system of a vehicle has at least the following steps: upon the presence of a brake request signal, outputting a brake control signal and building up a brake pressure by a braking medium at a wheel brake of a vehicle wheel, measuring a wheel speed of the vehicle wheel to be braked, and determining a wheel slip of the vehicle wheel, upon meeting a first traction criterion or a locking tendency of the vehicle wheel, activating a wheel drive unit and applying a wheel drive torque on the vehicle wheel to increase the wheel circumferential velocity and to reduce the wheel slip until a second traction criterion is met. The brake force introduced in the wheel brake is controlled as a function of the wheel slip by releasing the brake pressure upon satisfying a first traction criterion.
    Type: Application
    Filed: June 17, 2022
    Publication date: October 13, 2022
    Inventors: Steffen Gerlach, Alexander Rodenberg, Michael Schomburg
  • Patent number: 7657077
    Abstract: A method of determining defects in a plurality of images having essentially the same image contents is disclosed. A comparison operation is carried out once three fully comparable images having essentially the same image contents are present in the intermediate memory. The stored individual images are accessed randomly. A paired comparison operation between the three difference images is carried out.
    Type: Grant
    Filed: February 28, 2006
    Date of Patent: February 2, 2010
    Assignee: Vistec Semiconductor Systems GmbH
    Inventors: Detlef Michelsson, Steffen Gerlach, Bernd Jungmann
  • Patent number: 7387859
    Abstract: A method for measuring overlay shift is disclosed. An image is acquired of at least one reference element that comprises at least one first pattern element in a first plane and at least one second pattern element in a second plane. An image of a measurement element is likewise acquired. The shift value between the reference element and measurement element is ascertained by comparing the image of the reference element with the image of the measurement element. An output on a user interface indicates whether a predefined tolerance value is being exceeded.
    Type: Grant
    Filed: July 16, 2004
    Date of Patent: June 17, 2008
    Assignee: Vistec Semiconductor Systems GmbH
    Inventor: Steffen Gerlach
  • Publication number: 20060204109
    Abstract: A method of determining defects in a plurality of images having essentially the same image contents is disclosed. A comparison operation is carried out once three fully comparable images having essentially the same image contents are present in the intermediate memory. The stored individual images are accessed randomly. A paired comparison operation between the three difference images is carried out.
    Type: Application
    Filed: February 28, 2006
    Publication date: September 14, 2006
    Applicant: Leica Microsystems Semiconductor GmbH
    Inventors: Detlef Michelsson, Steffen Gerlach, Bernd Jungmann
  • Publication number: 20050037270
    Abstract: A method for measuring overlay shift is disclosed. An image is acquired of at least one reference element that comprises at least one first pattern element in a first plane and at least one second pattern element in a second plane. An image of a measurement element is likewise acquired. The shift value between the reference element and measurement element is ascertained by comparing the image of the reference element with the image of the measurement element. An output on a user interface indicates whether a predefined tolerance value is being exceeded.
    Type: Application
    Filed: July 16, 2004
    Publication date: February 17, 2005
    Inventor: Steffen Gerlach