Patents by Inventor Steffen M. Sonnekalb

Steffen M. Sonnekalb has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7574631
    Abstract: Circuit arrangement for secure data processing for program data with a protected data record. An internal memory provides a protected data record having instruction words and a first check word associated with the instruction words. An arithmetic and logic unit has an input coupled to the internal memory and outputs the first check word from the applied protected data record. A checking apparatus has an input coupled between the internal memory and the arithmetic and logic unit, and allocates a second check word to the instruction words in the protected data record. A comparison apparatus has respective inputs coupled to the checking apparatus and the arithmetic and logic unit, and compares the first check word with the second check word, and outputs an alarm signal when the first check word does not match the second check word.
    Type: Grant
    Filed: February 15, 2006
    Date of Patent: August 11, 2009
    Assignee: Infineon Technologies AG
    Inventors: Franz Klug, Steffen M. Sonnekalb
  • Patent number: 7529999
    Abstract: An integrated circuit arrangement including at least one circuit part which is designed to run through a functional self test and to output test results of the functional self test, and a testing unit, which is coupled to an input and an output and which is coupled to the at least one circuit part via testing lines. The testing unit is designed to start the functional self test when a starting signal for the functional self test is applied to the input, to evaluate test results that are present to determine whether they have a predefined relationship with predefined values, and to output data indicating the test result at the output. The testing unit is also designed to start the functional self test by internal circuit means and to evaluate the test results present.
    Type: Grant
    Filed: September 8, 2006
    Date of Patent: May 5, 2009
    Assignee: Infineon Technologies AG
    Inventors: Marcus Janke, Dirk Rabe, Steffen M. Sonnekalb
  • Patent number: 7468931
    Abstract: A memory arrangement having a memory area with a plurality of memory locations, to which external addresses can be allocated, and an address decoder which is coupled to the memory area and which includes an address input for applying an external address. The address decoder can be switched so that one of the external addresses of an address range is allocated to each memory location of the memory area, or that one of the external addresses of a sub-address range of the address range is allocated to each memory location only within a part-memory area of the memory area. The address decoder is also arranged for identifying the memory location allocated to the external address applied.
    Type: Grant
    Filed: July 18, 2006
    Date of Patent: December 23, 2008
    Assignee: Infineon Technologies AG
    Inventors: Andreas Wenzel, Stefan Ruping, Steffen M. Sonnekalb