Patents by Inventor Steffen Neidhardt

Steffen Neidhardt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200049814
    Abstract: A method for determining the three-dimensional alignment of components of a radar system is described. The radar system is provided that comprises at least one portion which is permeable by radar signals. The radar system is imaged by using millimeter waves emitted by an imaging system. In the image obtained, it is determined the highest magnitude reflection coinciding with at least one of an expected location and an expected distance of the surface of a first component of the radar system being of interest. At least one of the position and the distance of that surface is determined. From the measurement, the relative phase information received from each portion of that surface at the determined position and/or the determined distance is obtained. Processing the phase information obtained so as to obtain the azimuth and tilt of the surface. Further, a testing system is described.
    Type: Application
    Filed: August 6, 2019
    Publication date: February 13, 2020
    Applicant: Rohde & Schwarz GmbH & Co. KG
    Inventors: Steffen Neidhardt, Frank Gumbmann, Sherif Sayed Ahmed, Benedikt Simper
  • Publication number: 20190056441
    Abstract: A vector network analyzer comprises a first measuring port, a first digital interface, connected to the first measuring port, adapted to be connected to a digital input or output of a device under test, and a second measuring port, adapted to be connected to a radio frequency input or output of the device under test. It also comprises a processor, adapted to determine S-parameters of the device under test based upon measuring signals transmitted to the device under test and receive from the device under test by the first measuring port and the second measuring port.
    Type: Application
    Filed: February 19, 2018
    Publication date: February 21, 2019
    Inventors: Steffen HEUEL, Steffen NEIDHARDT, Thilo BEDNORZ
  • Patent number: 9869743
    Abstract: A calibration module with a substrate provides at least one high-frequency terminal integrated on the substrate which can be connected in each case with an allocated switching element integrated on the substrate to one of several allocated calibration standards or to an allocated power detector. The calibration standards and the power detector are integrated on the substrate.
    Type: Grant
    Filed: December 16, 2014
    Date of Patent: January 16, 2018
    Assignee: ROHDE & SCHWARZ GMBH & CO. KG
    Inventors: Martin Leibfritz, Steffen Neidhardt
  • Patent number: 9391719
    Abstract: A method for determining the place of origin of a passive intermodulation product excites a distributed device under test with two first excitation signals (x1(t), x2(t), each with a single spectral line, of which the frequencies (f1, f2) provide a frequency spacing relative to one another. Following this, the phase (?IM3Meas) of a first passive intermodulation product generated at the place of origin in the distributed device under test from the first excitation signals ((x1(t), x2(t)) by nonlinear distortion is measured, and the delay time of the first passive intermodulation product from the place of origin to the measuring device is calculated from the measured phase (x1(t), x2(t)) and the frequency (2·f1?f2) of the first passive intermodulation product. Finally, the place of origin of the passive intermodulation product is determined from the delay time and the topology of the distributed device under test.
    Type: Grant
    Filed: July 29, 2011
    Date of Patent: July 12, 2016
    Assignee: ROHDE & SCHWARZ GMBH & CO. KG
    Inventors: Steffen Neidhardt, Christian Evers
  • Publication number: 20150177357
    Abstract: A calibration module with a substrate provides at least one high-frequency terminal integrated on the substrate which can be connected in each case with an allocated switching element integrated on the substrate to one of several allocated calibration standards or to an allocated power detector. The calibration standards and the power detector are integrated on the substrate.
    Type: Application
    Filed: December 16, 2014
    Publication date: June 25, 2015
    Inventors: Martin LEIBFRITZ, Steffen NEIDHARDT
  • Publication number: 20150177300
    Abstract: A system for determining scattering parameters of a frequency-converting device under test using a network analyzer determines the system errors which occur between the individual ports (1, 2) of the frequency-converting device under test (3) and the ports (4, 5) of the network analyzer (6) connected to the ports (1, 2) of the frequency-converting device under test (3) and measures the system-error-containing signals incoming and outgoing in each case at the individual ports (1, 2) of the frequency-converting device under test (3).
    Type: Application
    Filed: October 10, 2013
    Publication date: June 25, 2015
    Inventors: Andreas Paech, Georg Ortler, Steffen Neidhardt
  • Patent number: 8983796
    Abstract: A network analyzer for measuring a group delay time, which is caused by a device under test to be measured, generates an excitation signal comprising two signals (xIn1(t),xIn2(t)) spaced by a frequency difference, excites the device with the excitation signal and measures a response signal comprising two signals (xOut1(t),xOut2(t)), which are respectively phase distorted by the device relative to the signals (xIn1(t),xIn2(t)) of the excitation signal. It determines the phase difference (??In) between the signals (xIn1(t),xIn2(t)) associated with the excitation signal and a phase difference (??Out) between the signals (xOut1(t), xOut2(t)) associated with the response signal. Finally, it calculates the group delay time from the phase difference (??In) of the signals (xIn1(t),xIn2(t)) associated with the excitation signal, the phase difference (??Out) of the signals (xOut1(t),xOut2(t) associated with the response signal and the frequency difference.
    Type: Grant
    Filed: January 15, 2010
    Date of Patent: March 17, 2015
    Assignee: Rohde & Schwarz GmbH & Co., KG
    Inventors: Thilo Bednorz, Steffen Neidhardt
  • Publication number: 20130054169
    Abstract: A method for determining the place of origin of a passive intermodulation product excites a distributed device under test with two first excitation signals (x1(t),x2(t), each with a single spectral line, of which the frequencies (f1,f2) provide a frequency spacing relative to one another. Following this, the phase (?IM3Meas) of a first passive intermodulation product generated at the place of origin in the distributed device under test from the first excitation signals ((x1(t), x2(t)) by nonlinear distortion is measured, and the delay time of the first passive intermodulation product from the place of origin to the measuring device is calculated from the measured phase (x1(t),x2(t)) and the frequency (2·f1?f2) of the first passive intermodulation product. Finally, the place of origin of the passive intermodulation product is determined from the delay time and the topology of the distributed device under test.
    Type: Application
    Filed: July 29, 2011
    Publication date: February 28, 2013
    Applicant: Rohde & Schwarz GmbH & Co. KG
    Inventors: Steffen Neidhardt, Christian Evers
  • Publication number: 20110288820
    Abstract: A network analyzer for measuring a group delay time, which is caused by a device under test to be measured, generates an excitation signal comprising two signals (xIn1(t),xIn2(t)) spaced by a frequency difference, excites the device with the excitation signal and measures a response signal comprising two signals (xOut1(t),xOut2(t)), which are respectively phase distorted by the device relative to the signals (xIn1(t),xIn2(t)) of the excitation signal. It determines the phase difference (??In) between the signals (xIn1(t),xIn2(t)) associated with the excitation signal and a phase difference (??Out) between the signals (xOut1(t), xOut2(t)) associated with the response signal. Finally, it calculates the group delay time from the phase difference (??In) of the signals (xIn1(t),xIn2(t)) associated with the excitation signal, the phase difference (??Out) of the signals (xOut1(t),xOut2(t) associated with the response signal and the frequency difference.
    Type: Application
    Filed: January 15, 2010
    Publication date: November 24, 2011
    Applicant: Rohde & Schwarz GmbH & Co. KG
    Inventors: Thilo Bednorz, Steffen Neidhardt