Abstract: The present invention relates to an ignition coil for generating a high-voltage pulse with a superimposed high-frequency voltage. The ignition coil comprises a first coil arranged on the primary side, a second coil arranged on the secondary side, a magnetic core and a third coil. The windings of the first coil and of the second coil are wound around the magnetic core. The second coil and the third coil are electrically connected to one another. A high-frequency terminal, which receives the high-frequency voltage, is electrically connected to the second coil and to the third coil.

Abstract: The present invention relates to an ignition coil for generating a high-voltage pulse with a superimposed high-frequency voltage. The ignition coil comprises a first coil arranged on the primary side, a second coil arranged on the secondary side, a magnetic core and a third coil. The windings of the first coil and of the second coil are wound around the magnetic core. The second coil and the third coil are electrically connected to one another. A high-frequency terminal, which receives the high-frequency voltage, is electrically connected to the second coil and to the third coil.

Abstract: A contact element having an outer conductor and an inner conductor, which is arranged within the outer conductor, wherein the outer conductor has, in one of its longitudinally axial end faces, at least one contact point for a contact with a contact point on a component part with which contact is to be made. In this case, the contact point is mounted in a spring-like manner.

Abstract: A device for contacting a circuit board having one or more contact elements, an intake into which at least one section of the circuit board can be inserted, an actuator for moving the circuit board relative to the contact elements until the contact elements are contacted, and at least one securing component for fixing the circuit board in the position in which the contact elements are contacted.

Abstract: A high frequency test prod for electrically contacting at least one contact point of a specimen, using an HF coaxial line to connect the test prod housing and the contact unit electrically and mechanically between the housing and the contact unit, the HF coaxial line having an external conductor, an internal conductor arranged coaxially to the external conductor, and a gas or vacuum dielectric arranged between the external conductor and internal conductor, the external conductor designed as a hollow profile section from a rigid, elastically deformable material, wherein the internal conductor is arranged coaxially to the hollow profile section.

Abstract: A contact element having an outer conductor and an inner conductor, which is arranged within the outer conductor, wherein the outer conductor has, in one of its longitudinally axial end faces, at least one contact point for a contact with a contact point on a component part with which contact is to be made. In this case, the contact point is mounted in a spring-like manner.

Abstract: A device for contacting a circuit board having one or more contact elements, an intake into which at least one section of the circuit board can be inserted, an actuator for moving the circuit board relative to the contact elements until the contact elements are contacted, and at least one securing component for fixing the circuit board in the position in which the contact elements are contacted.

Abstract: A test prod for high-frequency measurement having a contact-side end for electrically contacting planar structures and a cable-side end, for connecting to a cable, wherein between the contact-side end and the cable-side end a coplanar conductor structure having at least two conductors is arranged, wherein on the coplanar conductor structure a dielectric is arranged over a predetermined section between the cable-side end and the contact-side end, wherein the test prod is between the dielectric and the contact-side end such that the conductors of the coplanar conductor structure are arranged freely in space and relative to the dielectric in a suspending manner, wherein on one side of the test prod facing towards the planar structure a shielding element is arranged extending into the area of the coplanar conductor structure.

Abstract: A high frequency test prod for electrically contacting at least one contact point of a specimen, using an HF coaxial line to connect the test prod housing and the contact unit electrically and mechanically between the housing and the contact unit, the HF coaxial line having an external conductor, an internal conductor arranged coaxially to the external conductor, and a gas or vacuum dielectric arranged between the external conductor and internal conductor, the external conductor designed as a hollow profile section from a rigid, elastically deformable material, wherein the internal conductor is arranged coaxially to the hollow profile section.

Abstract: A test prod for high-frequency measurement having a contact-side end for electrically contacting planar structures and a cable-side end, for connecting to a cable, wherein between the contact-side end and the cable-side end a coplanar conductor structure having at least two conductors is arranged, wherein on the coplanar conductor structure a dielectric is arranged over a predetermined section between the cable-side end and the contact-side end, wherein the test prod is between the dielectric and the contact-side end such that the conductors of the coplanar conductor structure are arranged freely in space and relative to the dielectric in a suspending manner, wherein on one side of the test prod facing towards the planar structure a shielding element is arranged extending into the area of the coplanar conductor structure.

Abstract: The invention relates to a contact arrangement for a measuring probe or a measuring head for measuring high frequency, especially on a semiconductor wafer. The arrangement comprises a contact end for electrically contacting planar structures. A coplanar conductor structure having at lease two conductors carried by a dielectric is provided at the contact end. Between the dielectric and the contact end, the measuring tip is configured in such a manner that the conductors of the coplanar conductor structure are disposed in mid-air and in a resilient manner in relation to the dielectric retaining them. The invention is characterized in that the dielectric is provided with at least one arrangement for transmitting electrical signals, the arrangement being electrically connected to at least one conductor of the conductor structure in such a manner that the arrangement transmits signals from the at least one conductor that is electrically connected to the arrangement.

Abstract: The invention relates to a high frequency probe tip, particularly for printed circuit boards and/or HF cables, having a connecting end (10) to which a measuring cable may be connected for linking to a measuring device, with an earth contact (16) and a measuring tip (12), on which at least one signal contact (14) is formed, whereby a coaxial conductor (18) with an earth conductor arrangement (20) and at least one signal conductor (22) surrounded by a dielectric (24) connects the connecting end (10) to the measuring tip (12). Starting from the measuring tip (12), the earth conductor arrangement (20) is so designed over a predetermined region (30) of the high frequency probe tip that at least one of the signal conductors (22) is displaceable within the earth conductor arrangement (20) together with the dielectric (24) surrounding said signal conductor.