Patents by Inventor Steffen Wiesner

Steffen Wiesner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus to improve CT image acquisition using a displaced geometry
    Patent number: 8379791
    Abstract: A method and apparatus are provided to improve CT image acquisition using a displaced acquisition geometry. A CT apparatus may be used having a source (102) and a detector (104) transversely displaced from a center (114) of a field of view (118) during acquisition of the projection data. The amount of transverse displacement may be determined based on the size of the object (108). The source and the detector may be adjusted to vary the size of the transverse field of view. The first data set acquired by the detector may be reconstructed and used to simulate missing projection data that could not be acquired by the detector at each projection angle. The measured projection data and the simulated projection data may be used to obtain a second data set. The second data set may be compared to the first data set to produce a corrected data set.
    Type: Grant
    Filed: October 5, 2009
    Date of Patent: February 19, 2013
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Peter Forthmann, Thomas Koehler, Udo Van Stevendaal, Matthias Bertram, Steffen Wiesner, Colas Schretter
  • METHOD AND APPARATUS TO IMPROVE CT IMAGE ACQUISITION USING A DISPLACED GEOMETRY
    Publication number: 20110182400
    Abstract: A method and apparatus are provided to improve CT image acquisition using a displaced acquisition geometry. A CT apparatus may be used having a source (102) and a detector (104) transversely displaced from a center (114) of a field of view (118) during acquisition of the projection data. The amount of transverse displacement may be determined based on the size of the object (108). The source and the detector may be adjusted to vary the size of the transverse field of view. The first data set acquired by the detector may be reconstructed and used to simulate missing projection data that could not be acquired by the detector at each projection angle. The measured projection data and the simulated projection data may be used to obtain a second data set. The second data set may be compared to the first data set to produce a corrected data set.
    Type: Application
    Filed: October 5, 2009
    Publication date: July 28, 2011
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.
    Inventors: Peter Forthmann, Thomas Koehler, Udo Van Stevendaal, Matthias Bertram, Steffen Wiesner, Colas Schretter