Abstract: A computer-implemented method for indicating a long-term stress level of a person by means of a data processing unit, including the steps of acquiring stressor data having a set of stressor data items; analyzing stressor data values of the stressor data items by means of an artificial neural network to generate data representing a stress level, wherein the artificial neural network (ANN) is trained to provide output representing the stress level based on the stressor data values and an indication of previous stress state; and signaling the stress level.

Abstract: A computer-implemented method for indicating a long-term stress level of a person by means of a data processing unit, including the steps of acquiring stressor data having a set of stressor data items; analyzing stressor data values of the stressor data items by means of an artificial neural network to generate data representing a stress level, wherein the artificial neural network (ANN) is trained to provide output representing the stress level based on the stressor data values and an indication of previous stress state; and signaling the stress level.

Abstract: A method for testing an integrated circuit and an integrated circuit. The integrated circuit has an internal testing structure which may be accessed via an internal test access port and a control bus which is conducted to the outside via control ports, it being possible to switch over between a running mode and a test mode so that, in the test mode, the test access port is accessed via the control ports and the control bus, thus testing the integrated circuit.