Patents by Inventor Stephan Appen

Stephan Appen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6970006
    Abstract: The apparatus enables the automated testing, calibration and characterization of test adapters for semiconductor devices. A holder for the test adapter can be rotated in a defined manner. At least one probe head is provided which can be adjusted radially with respect to the holder. The probe head has two or more contact pins whose spacing distance is adjustable.
    Type: Grant
    Filed: October 14, 2004
    Date of Patent: November 29, 2005
    Assignee: Infineon Technologies AG
    Inventors: Stephan Appen, Michael Hübner, Michael Kund
  • Publication number: 20050046412
    Abstract: The apparatus enables the automated testing, calibration and characterization of test adapters for semiconductor devices. A holder for the test adapter can be rotated in a defined manner. At least one probe head is provided which can be adjusted radially with respect to the holder. The probe head has two or more contact pins whose spacing distance is adjustable.
    Type: Application
    Filed: October 14, 2004
    Publication date: March 3, 2005
    Inventors: Stephan Appen, Michael Hubner, Michael Kund
  • Publication number: 20020030480
    Abstract: The apparatus enables the automated testing, calibration and characterization of test adapters for semiconductor devices. A holder for the test adapter can be rotated in a defined manner. At least one probe head is provided which can be adjusted radially with respect to the holder. The probe head has two or more contact pins whose spacing distance is adjustable.
    Type: Application
    Filed: August 16, 2001
    Publication date: March 14, 2002
    Inventors: Stephan Appen, Michael Hubner, Michael Kund