Abstract: A substrate includes a first surface area; and a second surface area with a second roughness value. In a height profile of the substrate along a cutting line crossing the first surface area and the second surface area, a height of the substrate along a first section of the height profile is larger than the height of the substrate along a second section of the height profile. In the height profile an absolute value of a height difference between a point of maximum height or an averaged height, respectively, of the second section and a point of minimal height or an averaged height, respectively, of the first section defines a depth value. A ratio of the depth value and the second roughness value is between 2 and 35. A marking element extends across the first surface area and the second surface area.

Abstract: The present disclosure relates to a thin glass for an optical component that includes a first side with a first surface and a second side opposite the first side with a second surface. The thin glass has a three-dimensional shape with at least one target curvature and a thickness of less than 700 ?m. On at least one first measurement area of 3×3 mm2 of the first surface, all surface structure components in a wavelength range of 0.1 mm to 1 mm have an arithmetical mean height Sa of below 30 nm, below 20 nm, below 10 nm, or below 8 nm. On the first measurement area, all surface structure components in a wavelength range from 0.1 mm to 1 mm can have an arithmetical mean height Sa of between 1 nm and 30 nm, between 3 nm and 20 nm, or between 6 nm and 10 nm. The values for the arithmetical mean height refer to a measurement by means of white light interferometry, with a bandpass filtering of 0.1 mm to 1 mm, i.e. with a bandpass filtering for viewing surface structure components in wavelength ranges from 0.

Abstract: A substrate includes a first surface area; and a second surface area with a second roughness value. In a height profile of the substrate along a cutting line crossing the first surface area and the second surface area, a height of the substrate along a first section of the height profile is larger than the height of the substrate along a second section of the height profile. In the height profile an absolute value of a height difference between a point of maximum height or an averaged height, respectively, of the second section and a point of minimal height or an averaged height, respectively, of the first section defines a depth value. A ratio of the depth value and the second roughness value is between 2 and 35. A marking element extends across the first surface area and the second surface area.

Abstract: A method for the production of protection devices is provided. The method includes the step of providing a tile package. The provision of the tile package includes the steps of: laminating at least one board of a tile material onto a polymer foil; scoring the board on the side which is opposite to the polymer foil; and fracturing the board along the scoring lines for achieving a plurality of tiles which are fixed on the polymer foil.

Abstract: A method for the production of protection devices is provided. The method includes the step of providing a tile package. The provision of the tile package includes the steps of: laminating at least one board of a tile material onto a polymer foil; scoring the board on the side which is opposite to the polymer foil; and fracturing the board along the scoring lines for achieving a plurality of tiles which are fixed on the polymer foil.