Patents by Inventor Stephan Maxmilian Altmann

Stephan Maxmilian Altmann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Multiple local probe measuring device and method
    Patent number: 7312619
    Abstract: A local probe measuring device is provided for effecting local measurements of a sample. This device includes first and second local probes for local measurements with respect to a sample or a reference surface. A measurement condition adjustment arrangement is adapted to commonly adjust first and second measurement conditions of the respective first and second local probes with respect to the sample or the reference surface. A detection arrangement is provided that includes a first detection arrangement associated with the first local probe adapted to independently detect first measurement data referring to local measurements reflected by first local probe and a second detection arrangement associated with the second local probe adapted to independently detect second measurement data referring to local measurements effected by second local probe. Further, methods for effecting local measurements and local manipulations using multiple local probes are provided.
    Type: Grant
    Filed: July 17, 2006
    Date of Patent: December 25, 2007
    Assignee: Europaisches Laboratorium fur Molekularbiologie (EMBL)
    Inventors: Stephan Maxmilian Altmann, Johann Karl Heinrich Hörber
  • Multiple local probe measuring device and method
    Patent number: 7098678
    Abstract: A local probe measuring device is provided for effecting local measurements of a sample. This device includes first and second local probes for local measurements with respect to a sample or a reference surface. A measurement condition adjustment arrangement is adapted to commonly adjust first and second measurement conditions of the respective first and second local probes with respect to the sample or the reference surface. A detection arrangement is provided that includes first detection arrangement associated with the first local probe adapted to independently detect first measurement data referring to local measurements reflected by first local probe and a second detection arrangement associated with the second local probe adapted to independently detect second measurement data referring to local measurements effected by second local probe. Further, methods for effecting local measurements and local manipulations using multiple local probes are provided.
    Type: Grant
    Filed: April 22, 2005
    Date of Patent: August 29, 2006
    Assignee: Europaisches Laboratorium fur Molekularbiologie (EMBL)
    Inventors: Stephan Maxmilian Altmann, Johann Karl Heinrich Hörber