Patents by Inventor Stephan Paul George, II

Stephan Paul George, II has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • In-line metrology system
    Patent number: 9123584
    Abstract: A metrology system for gauging and spatially mapping a semiconductor material on a substrate can be used in controlling deposition and thermal activation processes.
    Type: Grant
    Filed: November 5, 2013
    Date of Patent: September 1, 2015
    Assignee: FIRST SOLAR, INC
    Inventors: Arnold Allenic, Stephan Paul George, II, Sreenivas Jayaraman, Oleh Petro Karpenko, Chong Lim
  • IN-LINE METROLOGY SYSTEM
    Publication number: 20140065731
    Abstract: A metrology system for gauging and spatially mapping a semiconductor material on a substrate can be used in controlling deposition and thermal activation processes.
    Type: Application
    Filed: November 5, 2013
    Publication date: March 6, 2014
    Applicant: FIRST SOLAR, INC
    Inventors: Arnold Allenic, Stephan Paul George, II, Sreenivas Jayaraman, Oleh Petro Karpenko, Chong Lim
  • In-line metrology system
    Patent number: 8603839
    Abstract: A metrology system for gauging and spatially mapping a semiconductor material on a substrate can be used in controlling deposition and thermal activation processes.
    Type: Grant
    Filed: July 25, 2011
    Date of Patent: December 10, 2013
    Assignee: First Solar, Inc.
    Inventors: Arnold Allenic, Stephan Paul George, II, Sreenivas Jayaraman, Oleh Karpenko, Chong Lim
  • IN-LINE METROLOGY SYSTEM
    Publication number: 20120021539
    Abstract: A metrology system for gauging and spatially mapping a semiconductor material on a substrate can be used in controlling deposition and thermal activation processes.
    Type: Application
    Filed: July 25, 2011
    Publication date: January 26, 2012
    Inventors: Arnold Allenic, Stephan Paul George, II, Sreenivas Jayaraman, Oleh Karpenko, Chong Lim