Abstract: A method for generating a resultant test plan includes generating a data record by measuring a measurement object. The method includes assigning at least part of the measurement object to an object class based on the data record. The method includes determining a test plan assigned to the object class as an object-class-specific test plan. The method includes determining the resultant test plan based on the object-class-specific test plan. The assignment is known in advance, between (a) object properties determinable based on data and the object class or (b) the object class and the object-class-specific test plan. The method includes creating an adapted assignment by adapting the assignment based on: (a) object properties of the measurement object currently measured or (b) the resultant test plan assigned to the measurement object. The determining the resultant test plan is performed based on the adapted assignment.

Abstract: A method for generating a resultant test plan for testing a measurement object includes generating at least one data record by measuring the measurement object. The method includes assigning at least part of the measurement object to at least one object class based on the at least one data record. The method includes determining a test plan assigned to the at least one object class as an object-class-specific test plan. The method includes determining the resultant test plan based on the object-class-specific test plan. The assignment of the at least part of the measurement object to the at least one object class is independent of dimensions.

Abstract: A computer device includes memory that stores a test plan for a coordinate measuring machine to perform an object measurement. The test plan includes at least one test feature for a plurality of reference elements of the object. The computer device includes at least one processor configured to execute instructions stored in the memory. The instructions include, for each of the reference elements, obtaining at least one accuracy variable. The accuracy variable specifies an accuracy of the measurement result of a respective reference element. The instructions include ascertaining an error effect of each reference element on the quantification of the test feature based on the respective accuracy variable. The instructions include ascertaining for each of the error effects whether it meets an error criterion and, if so, classifying a reference element assigned to this error effect as a critical reference element.

Abstract: A method for generating a test plan for testing a measurement object includes obtaining a data record representing the measurement object. The method includes setting a reference structure based on the data. The method includes assigning at least one reference structure-specific test feature to the reference structure. A test is carried out based on data for the data record representing the measurement object as to whether structures that are similar to or the same as the reference structure are present. The reference structure-specific test feature is assigned to each similar or same structure as the structure-specific test feature. The method includes generating the test plan to include the structure-specific test features.

Abstract: A computer device includes memory that stores a test plan for a coordinate measuring machine to perform an object measurement. The test plan includes at least one test feature for a plurality of reference elements of the object. The computer device includes at least one processor configured to execute instructions stored in the memory. The instructions include, for each of the reference elements, obtaining at least one accuracy variable. The accuracy variable specifies an accuracy of the measurement result of a respective reference element. The instructions include ascertaining an error effect of each reference element on the quantification of the test feature based on the respective accuracy variable. The instructions include ascertaining for each of the error effects whether it meets an error criterion and, if so, classifying a reference element assigned to this error effect as a critical reference element.

Abstract: An optical measuring device includes at least one optical sensor configured for optical capture of at least one measurement object at multiple image recording positions. The optical measuring device includes at least one display device configured to display, for multiple predetermined and/or determinable image recording positions, in each case a schematic representation of an image to be recorded at the respective image recording position. The optical measuring device includes at least one data processing unit and at least one interface. The interface is configured to provide at least one item of manipulation information to the data processing unit. The data processing unit is configured to, based on the manipulation information, adapt at least one of the image recording position and an image recording parameter of at least one of the images to be recorded.

Abstract: An optical measuring device includes at least one optical sensor configured for optical capture of at least one measurement object at multiple image recording positions. The optical measuring device includes at least one display device configured to display, for multiple predetermined and/or determinable image recording positions, in each case a schematic representation of an image to be recorded at the respective image recording position. The optical measuring device includes at least one data processing unit and at least one interface. The interface is configured to provide at least one item of manipulation information to the data processing unit. The data processing unit is configured to, based on the manipulation information, adapt at least one of the image recording position and an image recording parameter of at least one of the images to be recorded.

Abstract: A method for generating a resultant test plan for testing a measurement object includes generating at least one data record by measuring the measurement object. The method includes assigning at least part of the measurement object to at least one object class based on the at least one data record. The method includes determining a test plan assigned to the at least one object class as an object-class-specific test plan. The method includes determining the resultant test plan based on the object-class-specific test plan. The assignment of the at least part of the measurement object to the at least one object class is independent of dimensions.

Abstract: A method for generating a test plan for testing a measurement object includes obtaining a data record representing the measurement object. The method includes setting a reference structure based on the data. The method includes assigning at least one reference structure-specific test feature to the reference structure. A test is carried out based on data for the data record representing the measurement object as to whether structures that are similar to or the same as the reference structure are present. The reference structure-specific test feature is assigned to each similar or same structure as the structure-specific test feature. The method includes generating the test plan to include the structure-specific test features.

Abstract: A computer device includes memory that stores a test plan for a coordinate measuring machine to perform an object measurement. The test plan includes at least one test feature for a plurality of reference elements of the object. The computer device includes at least one processor configured to execute instructions stored in the memory. The instructions include, for each of the reference elements, obtaining at least one accuracy variable. The accuracy variable specifies an accuracy of the measurement result of a respective reference element. The instructions include ascertaining an error effect of each reference element on the quantification of the test feature based on the respective accuracy variable. The instructions include ascertaining for each of the error effects whether it meets an error criterion and, if so, classifying a reference element assigned to this error effect as a critical reference element.

Abstract: A coordinate measuring machine comprising an optical sensor for optically capturing a workpiece; an illumination device for illuminating the workpiece; a pose determination unit for determining data relating to a workpiece pose including a position and orientation of the workpiece; a storage unit for storing (i) data relating to a reference pose including a position and orientation of a reference workpiece, and (ii) data relating to a reference light setting of the illumination device used for a measurement of the reference workpiece; and a control unit which is configured to control a light setting of the illumination device for a measurement of the workpiece by adapting the reference light setting based on a comparison of the stored data relating to the reference pose with the determined data relating to the workpiece pose.

Abstract: A coordinate measuring machine comprising an optical sensor for optically capturing a workpiece; an illumination device for illuminating the workpiece; a pose determination unit for determining data relating to a workpiece pose including a position and orientation of the workpiece; a storage unit for storing (i) data relating to a reference pose including a position and orientation of a reference workpiece, and (ii) data relating to a reference light setting of the illumination device used for a measurement of the reference workpiece; and a control unit which is configured to control a light setting of the illumination device for a measurement of the workpiece by adapting the reference light setting based on a comparison of the stored data relating to the reference pose with the determined data relating to the workpiece pose.

Abstract: The invention relates to a method and a device for generating at least one virtual image of a measurement object, in which a virtual position and/or a virtual orientation of the measurement object is determined and a virtual position and/or virtual orientation of at least one imaging or image recording device of a coordinate measuring machine is determined. The virtual image is generated on the basis of geometric data of the measurement object and on the basis of optical properties of the measurement object and the virtual image is additionally generated on the basis of imaging parameters of the imaging or image recording device.

Abstract: The invention relates to a method and a device for generating at least one virtual image of a measurement object, in which a virtual position and/or a virtual orientation of the measurement object is determined and a virtual position and/or virtual orientation of at least one imaging or image recording device of a coordinate measuring machine is determined. The virtual image is generated on the basis of geometric data of the measurement object and on the basis of optical properties of the measurement object and the virtual image is additionally generated on the basis of imaging parameters of the imaging or image recording device.